Alain Courteville

Person

Congenies, FR

People

Patents Grantslast 30 patents

Information Patent Grant
Device and method for imaging and interferometry measurements
- Patent number 12,163,777
- Issue date Dec 10, 2024
- FOGALE NANOTECH
- Alain Courteville
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and a system for characterizing structures through a substrate
- Patent number 12,123,698
- Issue date Oct 22, 2024
- UNITY SEMICONDUCTOR
- Alain Courteville
- G01 - MEASURING TESTING
Information Patent Grant
Method and a system for characterising structures through a substrate
- Patent number 12,079,979
- Issue date Sep 3, 2024
- UNITY SEMICONDUCTOR
- Wolfgang Alexander Iff
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Device and method for measuring interfaces of an optical element
- Patent number 11,808,656
- Issue date Nov 7, 2023
- FOGALE NANOTECH
- Alain Courteville
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus provided with a capacitive detection and electric line(s)...
- Patent number 11,731,285
- Issue date Aug 22, 2023
- FOGALE SENSORS
- Yacine Chakour
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Grant
Low-coherence reflectometry method and device employing time-freque...
- Patent number 11,226,188
- Issue date Jan 18, 2022
- FOGALE NANOTECH
- Alain Courteville
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Multi-distance detection device for a robot, and robot equipped wit...
- Patent number 10,919,157
- Issue date Feb 16, 2021
- FOGALE NANOTECH
- Didier Roziere
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Grant
Method for 2D/3D inspection of an object such as a wafer
- Patent number 10,240,977
- Issue date Mar 26, 2019
- UNITY SEMICONDUCTOR
- Gilles Fresquet
- G01 - MEASURING TESTING
Information Patent Grant
Chromatic confocal device and method for 2D/3D inspection of an obj...
- Patent number 9,739,600
- Issue date Aug 22, 2017
- UNITY SEMICONDUCTOR
- Gilles Fresquet
- G01 - MEASURING TESTING
Information Patent Grant
Chromatic confocal device and method for 2D/3D inspection of an obj...
- Patent number 9,494,529
- Issue date Nov 15, 2016
- FOGALE NANOTECH
- Gilles Fresquet
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for measuring heights of patterns
- Patent number 7,782,468
- Issue date Aug 24, 2010
- Nanotec Solution
- Alain Courteville
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND A SYSTEM FOR CHARACTERISING STRUCTURES THROUGH A SUBSTRATE
- Publication number 20240281955
- Publication date Aug 22, 2024
- Unity Semiconductor
- Wolfgang Alexander IFF
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
METHOD AND A SYSTEM FOR CHARACTERISING STRUCTURES THROUGH A SUBSTRATE
- Publication number 20230377121
- Publication date Nov 23, 2023
- Unity Semiconductor
- Wolfgang Alexander IFF
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
DEVICE AND METHOD FOR MEASURING INTERFACES OF AN OPTICAL ELEMENT
- Publication number 20230332885
- Publication date Oct 19, 2023
- FOGALE NANOTECH
- Sylvain PETITGRAND
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR IMAGING AND INTERFEROMETRY MEASUREMENTS
- Publication number 20220397392
- Publication date Dec 15, 2022
- FOGALE NANOTECH
- Alain COURTEVILLE
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR MEASURING INTERFACES OF AN OPTICAL ELEMENT
- Publication number 20220357236
- Publication date Nov 10, 2022
- FOGALE NANOTECH
- Alain COURTEVILLE
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR MONITORING THE ENVIRONMENT OF A ROBOT
- Publication number 20220130147
- Publication date Apr 28, 2022
- FOGALE NANOTECH
- Alain COURTEVILLE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS HAVING A CAPACITIVE SENSING SYSTEM AND ELECTRIC LINE(S)
- Publication number 20210178606
- Publication date Jun 17, 2021
- FOGALE NANOTECH
- Yacine CHAKOUR
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Application
APPARATUS PROVIDED WITH A CAPACITIVE DETECTION AND ELECTRIC LINE(S)...
- Publication number 20210154860
- Publication date May 27, 2021
- FOGALE NANOTECH
- Yacine CHAKOUR
- G01 - MEASURING TESTING
Information Patent Application
LOW-COHERENCE REFLECTOMETRY METHOD AND DEVICE EMPLOYING TIME-FREQUE...
- Publication number 20210080246
- Publication date Mar 18, 2021
- FOGALE NANOTECH
- Alain COURTEVILLE
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
MULTI-DISTANCE DETECTION DEVICE FOR A ROBOT, AND ROBOT EQUIPPED WIT...
- Publication number 20200180162
- Publication date Jun 11, 2020
- FOGALE NANOTECH
- Didier ROZIERE
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Application
METHOD FOR 2D/3D INSPECTION OF AN OBJECT SUCH AS A WAFER
- Publication number 20170276615
- Publication date Sep 28, 2017
- FOGALE NANOTECH
- Gilles FRESQUET
- G01 - MEASURING TESTING
Information Patent Application
Method and device for measuring heights of patterns
- Publication number 20090303495
- Publication date Dec 10, 2009
- Alain Courteville
- G01 - MEASURING TESTING

Alain Courteville

Person

Patents Grantslast 30 patents

Device and method for imaging and interferometry measurements

Method and a system for characterizing structures through a substrate

Method and a system for characterising structures through a substrate

Device and method for measuring interfaces of an optical element

Apparatus provided with a capacitive detection and electric line(s)...

Low-coherence reflectometry method and device employing time-freque...

Multi-distance detection device for a robot, and robot equipped wit...

Method for 2D/3D inspection of an object such as a wafer

Chromatic confocal device and method for 2D/3D inspection of an obj...

Chromatic confocal device and method for 2D/3D inspection of an obj...

Method and device for measuring heights of patterns

Patents Applicationslast 30 patents

METHOD AND A SYSTEM FOR CHARACTERISING STRUCTURES THROUGH A SUBSTRATE

METHOD AND A SYSTEM FOR CHARACTERISING STRUCTURES THROUGH A SUBSTRATE

DEVICE AND METHOD FOR MEASURING INTERFACES OF AN OPTICAL ELEMENT

DEVICE AND METHOD FOR IMAGING AND INTERFEROMETRY MEASUREMENTS

DEVICE AND METHOD FOR MEASURING INTERFACES OF AN OPTICAL ELEMENT

METHOD AND DEVICE FOR MONITORING THE ENVIRONMENT OF A ROBOT

APPARATUS HAVING A CAPACITIVE SENSING SYSTEM AND ELECTRIC LINE(S)

APPARATUS PROVIDED WITH A CAPACITIVE DETECTION AND ELECTRIC LINE(S)...

LOW-COHERENCE REFLECTOMETRY METHOD AND DEVICE EMPLOYING TIME-FREQUE...

MULTI-DISTANCE DETECTION DEVICE FOR A ROBOT, AND ROBOT EQUIPPED WIT...

METHOD FOR 2D/3D INSPECTION OF AN OBJECT SUCH AS A WAFER

Method and device for measuring heights of patterns