Alain Prat

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Laissaud, FR

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Patents Grantslast 30 patents

Information Patent Grant
Device for the X-ray analysis of a specimen, comprising an energy/a...
- Patent number 8,155,267
- Issue date Apr 10, 2012
- Centre National de la Recherche Scientifique (Cnrs)
- Jean-Louis Hodeau
- G01 - MEASURING TESTING