Alain Salles

Person

Ramonville St Agne, FR

People

Patents Grantslast 30 patents

Information Patent Grant
ESD protection device, semiconductor device that includes an ESD pr...
- Patent number 10,727,221
- Issue date Jul 28, 2020
- NXP USA, INC.
- Rouying Zhan
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Electrostatic discharge protection circuit with a bi-directional si...
- Patent number 10,497,696
- Issue date Dec 3, 2019
- NXP USA, INC.
- Rouying Zhan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrostatic discharge tester
- Patent number 10,114,055
- Issue date Oct 30, 2018
- NXP USA, INC.
- Alain Salles
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit with integrated current sensor
- Patent number 10,041,978
- Issue date Aug 7, 2018
- NXP USA, INC.
- Alain Salles
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for testing a semiconductor device against electr...
- Patent number 9,897,644
- Issue date Feb 20, 2018
- NXP USA, INC.
- Alain Salles
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device and an integrated circuit comprising an ESD pr...
- Patent number 9,825,020
- Issue date Nov 21, 2017
- NXP USA, INC.
- Patrice Besse
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High bandwidth current sensor and method therefor
- Patent number 9,817,036
- Issue date Nov 14, 2017
- NXP USA, INC.
- Alain Salles
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device and an integrated circuit comprising an ESD pr...
- Patent number 9,620,495
- Issue date Apr 11, 2017
- NXP USA, INC.
- Patrice Besse
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrostatic discharge protection circuit arrangement, electronic...
- Patent number 9,438,031
- Issue date Sep 6, 2016
- FREESCALE SEMICONDUCTOR, INC.
- Patrice Besse
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR

Patents Applicationslast 30 patents

Information Patent Application
BATTERY MANAGEMENT SYSTEM INTERGRATED CIRCUIT
- Publication number 20230307724
- Publication date Sep 28, 2023
- NXP USA, Inc.
- Alain Salles
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ESD PROTECTION DEVICE, SEMICONDUCTOR DEVICE THAT INCLUDES AN ESD PR...
- Publication number 20190312026
- Publication date Oct 10, 2019
- NXP USA, Inc.
- Rouying ZHAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTROSTATIC DISCHARGE PROTECTION CIRCUIT WITH A BI-DIRECTIONAL SI...
- Publication number 20190074275
- Publication date Mar 7, 2019
- NXP USA, Inc.
- Rouying Zhan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND AN INTEGRATED CIRCUIT COMPRISING AN ESD PR...
- Publication number 20170179111
- Publication date Jun 22, 2017
- NXP USA, Inc.
- PATRICE BESSE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTROSTATIC DISCHARGE TESTER
- Publication number 20170160326
- Publication date Jun 8, 2017
- NXP USA, Inc.
- Alain Salles
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT WITH INTEGRATED CURRENT SENSOR
- Publication number 20150369845
- Publication date Dec 24, 2015
- FREESCALE SEMICONDUCTOR, INC.
- Alain Salles
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR TESTING A SEMICONDUCTOR DEVICE AGAINST ELECTR...
- Publication number 20150276847
- Publication date Oct 1, 2015
- FREESCALE SEMICONDUCTOR, INC.
- Alain Salles
- G01 - MEASURING TESTING
Information Patent Application
HIGH BANDWIDTH CURRENT SENSOR AND METHOD THEREFOR
- Publication number 20150276815
- Publication date Oct 1, 2015
- FREESCALE SEMICONDUCTOR, INC.
- Alain Salles
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE AND AN INTEGRATED CIRCUIT COMPRISING AN ESD PR...
- Publication number 20150221629
- Publication date Aug 6, 2015
- FREESCALE SEMICONDUCTOR, INC.
- Patrice Besse
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTROSTATIC DISCHARGE PROTECTION CIRCUIT ARRANGEMENT, ELECTRONIC...
- Publication number 20150049406
- Publication date Feb 19, 2015
- FREESCALE SEMICONDUCTOR, INC.
- Patrice Besse
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER

Alain Salles

Person

Patents Grantslast 30 patents

ESD protection device, semiconductor device that includes an ESD pr...

Electrostatic discharge protection circuit with a bi-directional si...

Electrostatic discharge tester

Integrated circuit with integrated current sensor

Method and system for testing a semiconductor device against electr...

Semiconductor device and an integrated circuit comprising an ESD pr...

High bandwidth current sensor and method therefor

Semiconductor device and an integrated circuit comprising an ESD pr...

Electrostatic discharge protection circuit arrangement, electronic...

Patents Applicationslast 30 patents

BATTERY MANAGEMENT SYSTEM INTERGRATED CIRCUIT

ESD PROTECTION DEVICE, SEMICONDUCTOR DEVICE THAT INCLUDES AN ESD PR...

ELECTROSTATIC DISCHARGE PROTECTION CIRCUIT WITH A BI-DIRECTIONAL SI...

SEMICONDUCTOR DEVICE AND AN INTEGRATED CIRCUIT COMPRISING AN ESD PR...

ELECTROSTATIC DISCHARGE TESTER

INTEGRATED CIRCUIT WITH INTEGRATED CURRENT SENSOR

METHOD AND SYSTEM FOR TESTING A SEMICONDUCTOR DEVICE AGAINST ELECTR...

HIGH BANDWIDTH CURRENT SENSOR AND METHOD THEREFOR

SEMICONDUCTOR DEVICE AND AN INTEGRATED CIRCUIT COMPRISING AN ESD PR...

ELECTROSTATIC DISCHARGE PROTECTION CIRCUIT ARRANGEMENT, ELECTRONIC...