Alain Thevenon

Person

Bretigny, FR

People

Patents Grantslast 30 patents

Information Patent Grant
Inclined-slit spectrograph
- Patent number 8,284,397
- Issue date Oct 9, 2012
- Horiba Jobin Yvon Sas
- Alain Thevenon
- G01 - MEASURING TESTING
Information Patent Grant
Spectrograph with a tilted detector window
- Patent number 7,782,455
- Issue date Aug 24, 2010
- Horiba Jobin Yvon S.A.S.
- Alain Thevenon
- G01 - MEASURING TESTING
Information Patent Grant
Device for adjusting angular play
- Patent number 6,507,399
- Issue date Jan 14, 2003
- Jobin Yvon Sa
- Philippe Andrieu
- G01 - MEASURING TESTING
Information Patent Grant
Modified concentric spectrograph
- Patent number 5,995,221
- Issue date Nov 30, 1999
- Instruments SA, Inc.
- Warren S. Slutter
- G01 - MEASURING TESTING
Information Patent Grant
System of photodetection and associated process for analyzing a lum...
- Patent number 5,889,586
- Issue date Mar 30, 1999
- Instruments S.A.
- Philippe Chauvin
- G01 - MEASURING TESTING
Information Patent Grant
Low noise optical system
- Patent number 5,002,393
- Issue date Mar 26, 1991
- Instruments S.A.
- Alain Thevenon
- G01 - MEASURING TESTING
Information Patent Grant
Diffraction apparatus with correcting grating and method of making
- Patent number 4,842,353
- Issue date Jun 27, 1989
- Instruments S.A.
- Alain Thevenon
- G02 - OPTICS
Information Patent Grant
Optical device for an emission spectrometer
- Patent number 4,645,344
- Issue date Feb 24, 1987
- Instruments, S.A.
- Alain Thevenon
- G01 - MEASURING TESTING
Information Patent Grant
Spectrometry device for analyzing polychromatic light
- Patent number 4,571,074
- Issue date Feb 18, 1986
- Instruments S.A.
- Alain Thevenon
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
INCLINED-SLIT SPECTROGRAPH
- Publication number 20100118299
- Publication date May 13, 2010
- HORIBA JOBIN YVON SAS
- Alain Thevenon
- G01 - MEASURING TESTING
Information Patent Application
SPECTROGRAPH WITH A TILTED DETECTOR WINDOW
- Publication number 20090231579
- Publication date Sep 17, 2009
- Alain THEVENON
- G01 - MEASURING TESTING

Alain Thevenon

Person

Patents Grantslast 30 patents

Inclined-slit spectrograph

Spectrograph with a tilted detector window

Device for adjusting angular play

Modified concentric spectrograph

System of photodetection and associated process for analyzing a lum...

Low noise optical system

Diffraction apparatus with correcting grating and method of making

Optical device for an emission spectrometer

Spectrometry device for analyzing polychromatic light

Patents Applicationslast 30 patents

INCLINED-SLIT SPECTROGRAPH

SPECTROGRAPH WITH A TILTED DETECTOR WINDOW