Membership
Tour
Register
Log in
Alan Aindow
Follow
Person
Alameda, CA, US
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Lidar system
Patent number
10,473,768
Issue date
Nov 12, 2019
Leica Geosystems AG
Gregory C. Walsh
G01 - MEASURING TESTING
Information
Patent Grant
LIDAR system
Patent number
9,599,468
Issue date
Mar 21, 2017
Leica Geosystems AG
Gregory C. Walsh
G01 - MEASURING TESTING
Information
Patent Grant
Photoemission monitoring of EUV mirror and mask surface contaminati...
Patent number
9,453,801
Issue date
Sep 27, 2016
KLA-Tencor Corporation
Li Wang
G01 - MEASURING TESTING
Information
Patent Grant
Lidar system
Patent number
8,896,818
Issue date
Nov 25, 2014
Leica Geosystems AG
Gregory C. Walsh
G01 - MEASURING TESTING
Information
Patent Grant
LIDAR system
Patent number
7,701,558
Issue date
Apr 20, 2010
Leica Geosystems AG
Gregory C. Walsh
G01 - MEASURING TESTING
Information
Patent Grant
Laser operation for survey instruments
Patent number
7,323,670
Issue date
Jan 29, 2008
Leica Geosystems HDS LLC
Gregory C. Walsh
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
LIDAR SYSTEM
Publication number
20170146641
Publication date
May 25, 2017
Leica Geosystems AG
Gregory C. Walsh
G01 - MEASURING TESTING
Information
Patent Application
LIDAR SYSTEM
Publication number
20150022800
Publication date
Jan 22, 2015
Leica Geosystems AG
Gregory C. Walsh
G01 - MEASURING TESTING
Information
Patent Application
PHOTOEMISSION MONITORING OF EUV MIRROR AND MASK SURFACE CONTAMINATI...
Publication number
20130313442
Publication date
Nov 28, 2013
KLA-Tencor Corporation, a Delaware Corporation
Li Wang
G01 - MEASURING TESTING
Information
Patent Application
LIDAR SYSTEM
Publication number
20110102764
Publication date
May 5, 2011
Leica Geosystems AG
Gregory C. Walsh
G01 - MEASURING TESTING
Information
Patent Application
Lidar system
Publication number
20080074640
Publication date
Mar 27, 2008
Gregory C. Walsh
G01 - MEASURING TESTING
Information
Patent Application
Laser operation for survey instruments
Publication number
20050205755
Publication date
Sep 22, 2005
Gregory C. Walsh
G01 - MEASURING TESTING