West Chester, PA, US
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Patent Grant
Agilent Technologies, Inc.
William E. Barber
G01 - MEASURING TESTING
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Patent Grant
Agilent Technologis, Inc.
Brian A. Bidlingmeyer
G01 - MEASURING TESTING
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Patent Grant
Hewlett-Packard Company
Leonid M. Blumberg
G01 - MEASURING TESTING
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Patent Application
Agilent Technologies, Inc.
Wu Chen
C07 - ORGANIC CHEMISTRY
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Patent Application
Brian A. Bidlingmeyer
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
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Patent Application
Agilent Technologies, Inc.
Bernd-Walter Hoffmann
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
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Patent Application
Alan D. Broske
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
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Patent Application
Agilent Technologies, Inc.
Robert Dallas Ricker
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
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Patent Application
Robert D. Ricker
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
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Patent Application
AGILENT TECHNOLOGIES, INC.
Alan D. Broske
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
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Patent Application
William E. Barber
G01 - MEASURING TESTING
Information
Patent Application
Brian A. Bidlingmeyer
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
