Alan D. Howard

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Everett, WA, US

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Patents Grantslast 30 patents

Information Patent Grant
Probe assembly with two spaced probes for high frequency circuit bo...
- Patent number 11,674,979
- Issue date Jun 13, 2023
- Huntron, Inc.
- Alan Howard
- G01 - MEASURING TESTING
Information Patent Grant
System for fault determination for electronic circuits
- Patent number 10,520,542
- Issue date Dec 31, 2019
- Huntron, Inc.
- Alan Howard
- G01 - MEASURING TESTING
Information Patent Grant
System and computer program product for performing comprehensive fu...
- Patent number 10,161,991
- Issue date Dec 25, 2018
- HUNTRON, INC.
- Alan Howard
- G01 - MEASURING TESTING
Information Patent Grant
Dual probe assembly for a printed circuit board test apparatus
- Patent number 7,091,730
- Issue date Aug 15, 2006
- Huntron, Inc.
- Mahesh P. Parshotam
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PROBE ASSEMBLY WITH TWO SPACED PROBES FOR HIGH FREQUENCY CIRCUIT BO...
- Publication number 20230120201
- Publication date Apr 20, 2023
- Alan Howard
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND COMPUTER PROGRAM PRODUCT FOR PERFORMING COMPREHENSIVE FU...
- Publication number 20180059169
- Publication date Mar 1, 2018
- Huntron, Inc.
- Alan Howard
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR FAULT DETERMINATION FOR ELECTRONIC CIRCUITS
- Publication number 20170343600
- Publication date Nov 30, 2017
- Huntron, Inc.
- Alan Howard
- G01 - MEASURING TESTING