Alan D Norris

Person

Hinesburg, VT, US

People

Patents Grantslast 30 patents

Information Patent Grant
Self-aligned Schottky diode
- Patent number 8,299,558
- Issue date Oct 30, 2012
- International Business Machines Corporation
- Alan B. Botula
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Self-aligned Schottky diode
- Patent number 8,008,142
- Issue date Aug 30, 2011
- International Business Machines Corporation
- Alan B. Botula
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
SOI substrate contact with extended silicide area
- Patent number 7,939,896
- Issue date May 10, 2011
- International Business Machines Corporation
- Dinh Dang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
SOI substrate contact with extended silicide area
- Patent number 7,675,121
- Issue date Mar 9, 2010
- International Business Machines Corporation
- Dinh Dang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for performing a burn-in test
- Patent number 7,463,548
- Issue date Dec 9, 2008
- International Business Machines Corporation
- Alan D. Norris
- G11 - INFORMATION STORAGE
Information Patent Grant
Method for performing a burn-in test
- Patent number 7,243,276
- Issue date Jul 10, 2007
- International Business Machines Corporation
- Alan D. Norris
- G11 - INFORMATION STORAGE
Information Patent Grant
Timer lockout circuit for synchronous applications
- Patent number 7,221,601
- Issue date May 22, 2007
- International Business Machines Corporation
- Mark D Jacunski
- G11 - INFORMATION STORAGE
Information Patent Grant
Command multiplier for built-in-self-test
- Patent number 7,194,670
- Issue date Mar 20, 2007
- International Business Machines Corp.
- Jonathan R. Fales
- G11 - INFORMATION STORAGE
Information Patent Grant
Timer lockout circuit for synchronous applications
- Patent number 7,068,564
- Issue date Jun 27, 2006
- International Business Machines Corporation
- Mark D Jacunski
- G11 - INFORMATION STORAGE
Information Patent Grant
Method for guaranteeing a minimum data strobe valid window and a mi...
- Patent number 6,708,298
- Issue date Mar 16, 2004
- International Business Machines Corporation
- William E. Corbin
- G11 - INFORMATION STORAGE
Information Patent Grant
Method for testing and guaranteeing that skew between two signals m...
- Patent number 6,658,604
- Issue date Dec 2, 2003
- International Business Machines Corporation
- William R. Corbin
- G11 - INFORMATION STORAGE
Information Patent Grant
Apparatus and method for performing a defect leakage screen test fo...
- Patent number 6,330,697
- Issue date Dec 11, 2001
- International Business Machines Corporation
- Michael P. Clinton
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
SELF-ALIGNED SCHOTTKY DIODE
- Publication number 20110284961
- Publication date Nov 24, 2011
- International Business Machines Corporation
- Alan B. Botula
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SELF-ALIGNED SCHOTTKY DIODE
- Publication number 20100230751
- Publication date Sep 16, 2010
- International Business Machines Corporation
- Alan B. Botula
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SOI SUBSTRATE CONTACT WITH EXTENDED SILICIDE AREA
- Publication number 20100084736
- Publication date Apr 8, 2010
- International Business Machines Corporation
- Dinh Dang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SOI SUBSTRATE CONTACT WITH EXTENDED SILICIDE AREA
- Publication number 20090093092
- Publication date Apr 9, 2009
- Dinh Dang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SOI SUBSTRATE CONTACT WITH EXTENDED SILICIDE AREA
- Publication number 20090090970
- Publication date Apr 9, 2009
- Dinh Dang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR PERFORMING A BURN-IN TEST
- Publication number 20070165481
- Publication date Jul 19, 2007
- Alan D. Norris
- G11 - INFORMATION STORAGE
Information Patent Application
Timer lockout circuit for synchronous applications
- Publication number 20060152994
- Publication date Jul 13, 2006
- Mark D. Jacunski
- G11 - INFORMATION STORAGE
Information Patent Application
A Command Multiplier for Built-In-Self-Test
- Publication number 20050193253
- Publication date Sep 1, 2005
- International Business Machines Corporation
- Jonathan R. Fales
- G11 - INFORMATION STORAGE
Information Patent Application
METHOD FOR PERFORMING A BURN-IN TEST
- Publication number 20050102590
- Publication date May 12, 2005
- International Business Machines Corporation
- Alan D. Norris
- G11 - INFORMATION STORAGE
Information Patent Application
Timer lockout circuit for synchronous applications
- Publication number 20040264289
- Publication date Dec 30, 2004
- International Business Machines Corporation
- Mark D Jacunski
- G11 - INFORMATION STORAGE
Information Patent Application
Internal data generation and compare via unused external pins
- Publication number 20040133827
- Publication date Jul 8, 2004
- International Business Machines Corporation
- Alan D. Norris
- G11 - INFORMATION STORAGE
Information Patent Application
Method for guaranteeing a minimum data strobe valid window and a mi...
- Publication number 20020099987
- Publication date Jul 25, 2002
- International Business Machines Corporation
- William R. Corbin
- G11 - INFORMATION STORAGE

Alan D Norris

Person

Patents Grantslast 30 patents

Self-aligned Schottky diode

Self-aligned Schottky diode

SOI substrate contact with extended silicide area

SOI substrate contact with extended silicide area

Method for performing a burn-in test

Method for performing a burn-in test

Timer lockout circuit for synchronous applications

Command multiplier for built-in-self-test

Timer lockout circuit for synchronous applications

Method for guaranteeing a minimum data strobe valid window and a mi...

Method for testing and guaranteeing that skew between two signals m...

Apparatus and method for performing a defect leakage screen test fo...

Patents Applicationslast 30 patents

SELF-ALIGNED SCHOTTKY DIODE

SELF-ALIGNED SCHOTTKY DIODE

SOI SUBSTRATE CONTACT WITH EXTENDED SILICIDE AREA

SOI SUBSTRATE CONTACT WITH EXTENDED SILICIDE AREA

SOI SUBSTRATE CONTACT WITH EXTENDED SILICIDE AREA

METHOD FOR PERFORMING A BURN-IN TEST

Timer lockout circuit for synchronous applications

A Command Multiplier for Built-In-Self-Test

METHOD FOR PERFORMING A BURN-IN TEST

Timer lockout circuit for synchronous applications

Internal data generation and compare via unused external pins

Method for guaranteeing a minimum data strobe valid window and a mi...