Alan Frank de Jong

Person

Eindhoven, NL

People

Patents Grantslast 30 patents

Information Patent Grant
Arrangement for X-Ray tomography
- Patent number 9,958,403
- Issue date May 1, 2018
- FEI Company
- Pavel Stejskal
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Micro-reactor for observing particles in a fluid
- Patent number 9,162,211
- Issue date Oct 20, 2015
- FEI Company
- Gerard Anne Nicolaas Van Veen
- G01 - MEASURING TESTING
Information Patent Grant
Method of use for a multipole detector for a transmission electron...
- Patent number 8,692,196
- Issue date Apr 8, 2014
- FEI Company
- Peter Christiaan Tiemeijer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam processing
- Patent number 8,598,542
- Issue date Dec 3, 2013
- FEI Company
- Milos Toth
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Method for forming microscopic 3D structures
- Patent number 8,597,565
- Issue date Dec 3, 2013
- FEI Company
- Jacob Simon Faber
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method of using a direct electron detector for a TEM
- Patent number 8,592,762
- Issue date Nov 26, 2013
- FEI Company
- Uwe Luecken
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle microscopy imaging method
- Patent number 8,581,189
- Issue date Nov 12, 2013
- FEI Company
- Faysal Boughorbel
- G01 - MEASURING TESTING
Information Patent Grant
TEM with aberration corrector and phase plate
- Patent number 7,915,584
- Issue date Mar 29, 2011
- FEI Company
- Peter Christiaan Tiemeijer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle-optical apparatus including a low-temperature specimen holder
- Patent number 5,986,270
- Issue date Nov 16, 1999
- U.S. Philips Corporation
- Bernardus J. M. Bormans
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Energy filter with correction of a second-order chromatic aberration
- Patent number 5,448,063
- Issue date Sep 5, 1995
- U.S. Philips Corporation
- Alan F. De Jong
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for autotuning of an electron microscope, and an electron mi...
- Patent number 5,233,192
- Issue date Aug 3, 1993
- U.S. Philips Corporation
- Alan F. De Jong
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device
- Patent number 5,221,844
- Issue date Jun 22, 1993
- U.S. Philips Corp.
- Karel D. van der Mast
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
ARRANGEMENT FOR X-RAY TOMOGRAPHY
- Publication number 20180100815
- Publication date Apr 12, 2018
- FEI Company
- Pavel Stejskal
- G01 - MEASURING TESTING
Information Patent Application
Charged-Particle Microscopy Imaging Method
- Publication number 20130037714
- Publication date Feb 14, 2013
- FEI Company
- Faysal Boughorbel
- G01 - MEASURING TESTING
Information Patent Application
MICRO-REACTOR FOR OBSERVING PARTICLES IN A FLUID
- Publication number 20110097706
- Publication date Apr 28, 2011
- FEI Company
- Gerard Anne Nicolaas van Veen
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
TEM WITH ABERRATION CORRECTOR AND PHASE PLATE
- Publication number 20090200464
- Publication date Aug 13, 2009
- FEI Company
- Peter Christiaan Tiemeijer
- H01 - BASIC ELECTRIC ELEMENTS

Alan Frank de Jong

Person

Patents Grantslast 30 patents

Arrangement for X-Ray tomography

Micro-reactor for observing particles in a fluid

Method of use for a multipole detector for a transmission electron...

Charged particle beam processing

Method for forming microscopic 3D structures

Method of using a direct electron detector for a TEM

Charged particle microscopy imaging method

TEM with aberration corrector and phase plate

Particle-optical apparatus including a low-temperature specimen holder

Energy filter with correction of a second-order chromatic aberration

Method for autotuning of an electron microscope, and an electron mi...

Charged particle beam device

Patents Applicationslast 30 patents

ARRANGEMENT FOR X-RAY TOMOGRAPHY

Charged-Particle Microscopy Imaging Method

MICRO-REACTOR FOR OBSERVING PARTICLES IN A FLUID

TEM WITH ABERRATION CORRECTOR AND PHASE PLATE