Alan H. Leek

Person

Frisco, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
Tamper detection
- Patent number 11,805,596
- Issue date Oct 31, 2023
- Texas Instruments Incorporated
- Alan Henry Leek
- G01 - MEASURING TESTING
Information Patent Grant
Tamper detection
- Patent number 10,925,154
- Issue date Feb 16, 2021
- Texas Instruments Incorporated
- Alan Henry Leek
- G01 - MEASURING TESTING
Information Patent Grant
Material determination by sweeping a range of frequencies
- Patent number 10,684,235
- Issue date Jun 16, 2020
- Texas Instruments Incorporated
- Alan H. Leek
- G01 - MEASURING TESTING
Information Patent Grant
Impedance signature analyzer to control automated actions
- Patent number 10,514,348
- Issue date Dec 24, 2019
- Texas Instruments Incorporated
- Charles Kasimer Sestok
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Grant
Material-discerning proximity sensing
- Patent number 10,474,307
- Issue date Nov 12, 2019
- Texas Instruments Incorporated
- Alan Henry Leek
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Square-wave-based impedance analysis
- Patent number 10,191,097
- Issue date Jan 29, 2019
- Texas Instruments Incorporated
- Charles Kasimer Sestok
- G01 - MEASURING TESTING
Information Patent Grant
Impedance signature analyzer to control automated actions
- Patent number 9,902,068
- Issue date Feb 27, 2018
- Texas Instruments Incorporated
- Charles Kasimer Sestok
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Grant
Material-discerning sensing by measurement of different points of i...
- Patent number 9,599,739
- Issue date Mar 21, 2017
- Texas Instruments Incorporated
- Alan H. Leek
- G01 - MEASURING TESTING
Information Patent Grant
Material determination by sweeping a range of frequencies
- Patent number 9,575,014
- Issue date Feb 21, 2017
- Texas Instruments Incorporated
- Alan H. Leek
- G01 - MEASURING TESTING
Information Patent Grant
Material-discerning proximity sensing
- Patent number 9,201,548
- Issue date Dec 1, 2015
- Texas Instruments Incorporated
- Alan Henry Leek
- H03 - BASIC ELECTRONIC CIRCUITRY

Patents Applicationslast 30 patents

Information Patent Application
TAMPER DETECTION
- Publication number 20210168933
- Publication date Jun 3, 2021
- TEXAS INSTRUMENTS INCORPORATED
- Alan Henry Leek
- G01 - MEASURING TESTING
Information Patent Application
TAMPER DETECTION
- Publication number 20200253042
- Publication date Aug 6, 2020
- TEXAS INSTRUMENTS INCORPORATED
- Alan Henry Leek
- G01 - MEASURING TESTING
Information Patent Application
IMPEDANCE SIGNATURE ANALYZER TO CONTROL AUTOMATED ACTIONS
- Publication number 20180186006
- Publication date Jul 5, 2018
- TEXAS INSTRUMENTS INCORPORATED
- CHARLES KASIMER SESTOK
- A47 - FURNITURE DOMESTIC ARTICLES OR APPLIANCES COFFEE MILLS SPICE MILLS SUCT...
Information Patent Application
SQUARE-WAVE-BASED IMPEDANCE ANALYSIS
- Publication number 20180180652
- Publication date Jun 28, 2018
- TEXAS INSTRUMENTS INCORPORATED
- CHARLES KASIMER SESTOK
- G01 - MEASURING TESTING
Information Patent Application
Material Determination By Sweeping a Range of Frequencies
- Publication number 20170115237
- Publication date Apr 27, 2017
- TEXAS INSTRUMENTS INCORPORATED
- Alan H. Leek
- G01 - MEASURING TESTING
Information Patent Application
MATERIAL DETERMINATION BY SWEEPING A RANGE OF FREQUENCIES
- Publication number 20160178537
- Publication date Jun 23, 2016
- TEXAS INSTRUMENTS INCORPORATED
- Alan H. Leek
- G01 - MEASURING TESTING
Information Patent Application
MATERIAL-DISCERNING SENSING BY MEASUREMENT OF DIFFERENT POINTS OF I...
- Publication number 20160070017
- Publication date Mar 10, 2016
- TEXAS INSTRUMENTS INCORPORATED
- Alan H. Leek
- G01 - MEASURING TESTING
Information Patent Application
MATERIAL-DISCERNING PROXIMITY SENSING
- Publication number 20130293244
- Publication date Nov 7, 2013
- Texas Instruments, Incorporated
- Alan Henry Leek
- G01 - MEASURING TESTING

Alan H. Leek

Person

Patents Grantslast 30 patents

Tamper detection

Tamper detection

Material determination by sweeping a range of frequencies

Impedance signature analyzer to control automated actions

Material-discerning proximity sensing

Square-wave-based impedance analysis

Impedance signature analyzer to control automated actions

Material-discerning sensing by measurement of different points of i...

Material determination by sweeping a range of frequencies

Material-discerning proximity sensing

Patents Applicationslast 30 patents

TAMPER DETECTION

TAMPER DETECTION

IMPEDANCE SIGNATURE ANALYZER TO CONTROL AUTOMATED ACTIONS

SQUARE-WAVE-BASED IMPEDANCE ANALYSIS

Material Determination By Sweeping a Range of Frequencies

MATERIAL DETERMINATION BY SWEEPING A RANGE OF FREQUENCIES

MATERIAL-DISCERNING SENSING BY MEASUREMENT OF DIFFERENT POINTS OF I...

MATERIAL-DISCERNING PROXIMITY SENSING