Alan J. Kempainen

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Ostrander, OH, US

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Patents Grantslast 30 patents

Information Patent Grant
Load cell residual fatigue life estimation system and method
- Patent number 9,638,756
- Issue date May 2, 2017
- Honeywell International Inc.
- Sivasubramanian Srinivasan
- G01 - MEASURING TESTING
Information Patent Grant
Modular load structure assembly having internal strain gaged sensing
- Patent number 9,261,419
- Issue date Feb 16, 2016
- Honeywell International Inc.
- Alan J. Kempainen
- G01 - MEASURING TESTING
Information Patent Grant
Three-axis low profile load cell and sensing beam
- Patent number 8,776,615
- Issue date Jul 15, 2014
- Honeywell International Inc.
- Alan J. Kempainen
- G01 - MEASURING TESTING
Information Patent Grant
Load pin with increased performance
- Patent number 8,474,326
- Issue date Jul 2, 2013
- Honeywell International Inc.
- Alan John Kempainen
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MODULAR LOAD STRUCTURE ASSEMBLY HAVING INTERNAL STRAIN GAGED SENSING
- Publication number 20150204738
- Publication date Jul 23, 2015
- Honeywell International Inc.
- Alan J. Kempainen
- G01 - MEASURING TESTING
Information Patent Application
LOAD CELL RESIDUAL FATIGUE LIFE ESTIMATION SYSTEM AND METHOD
- Publication number 20140163909
- Publication date Jun 12, 2014
- Honeywell International Inc.
- Sivasubramanian Srinivasan
- G01 - MEASURING TESTING
Information Patent Application
THREE-AXIS LOW PROFILE LOAD CELL AND SENSING BEAM
- Publication number 20130291653
- Publication date Nov 7, 2013
- Honeywell International Inc.
- Alan J. Kempainen
- G01 - MEASURING TESTING
Information Patent Application
LOAD PIN WITH INCREASED PERFORMANCE
- Publication number 20120234100
- Publication date Sep 20, 2012
- Honeywell International Inc.
- Alan John Kempainen
- G01 - MEASURING TESTING