Alan J. O'DONNELL

Person

Castletroy, IE

People

Patents Grantslast 30 patents

Information Patent Grant
Exposure monitor device
- Patent number 11,988,708
- Issue date May 21, 2024
- Analog Devices International Unlimited Company
- Edward John Coyne
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic field sensing based on particle position within container
- Patent number 11,940,502
- Issue date Mar 26, 2024
- Analog Devices International Unlimited Company
- Alan J. O'Donnell
- G01 - MEASURING TESTING
Information Patent Grant
Exposure monitor device
- Patent number 11,686,763
- Issue date Jun 27, 2023
- Analog Devices International Unlimited Company
- Edward John Coyne
- G01 - MEASURING TESTING
Information Patent Grant
Spark gap structures for detection and protection against electrica...
- Patent number 11,668,734
- Issue date Jun 6, 2023
- Analog Devices International Unlimited Company
- David J. Clarke
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Devices, systems and methods including magnetic structures and micr...
- Patent number 11,649,157
- Issue date May 16, 2023
- Analog Devices International Unlimited Company
- Alan J. O'Donnell
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Charge storage with electrical overstress protection
- Patent number 11,644,497
- Issue date May 9, 2023
- Analog Devices International Unlimited Company
- Alan J. O'Donnell
- G08 - SIGNALLING
Information Patent Grant
Electrical overstress detection device
- Patent number 11,372,030
- Issue date Jun 28, 2022
- Analog Devices International Unlimited Company
- David J. Clarke
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
3-axis angular accelerometer
- Patent number 11,313,876
- Issue date Apr 26, 2022
- Analog Devices, Inc.
- Xin Zhang
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Exposure monitor device
- Patent number 11,269,006
- Issue date Mar 8, 2022
- Analog Devices International Unlimited Company
- Edward John Coyne
- G01 - MEASURING TESTING
Information Patent Grant
System comprising a package having optically isolated micromachined...
- Patent number 11,228,310
- Issue date Jan 18, 2022
- Analog Devices Global Unlimited Company
- Ying Zhao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Storing charge associated with electrical overstress
- Patent number 11,193,967
- Issue date Dec 7, 2021
- Analog Devices Global
- Alan J. O'Donnell
- G08 - SIGNALLING
Information Patent Grant
Mounting structures for integrated device packages
- Patent number 11,127,716
- Issue date Sep 21, 2021
- Analog Devices International Unlimited Company
- Rigan McGeehan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Spark gap structures for detection and protection against electrica...
- Patent number 11,112,436
- Issue date Sep 7, 2021
- Analog Devices International Unlimited Company
- David J. Clarke
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Magnetic device with magnetic structure and micro-fluidic structure
- Patent number 11,061,086
- Issue date Jul 13, 2021
- Analog Devices Global
- Alan J. O'Donnell
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Optically isolated micromachined (MEMS) switches and related method...
- Patent number 10,848,152
- Issue date Nov 24, 2020
- Analog Devices Global Unlimited Company
- Ying Zhao
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Wear-out monitor device
- Patent number 10,794,950
- Issue date Oct 6, 2020
- Analog Devices Global
- Edward John Coyne
- G01 - MEASURING TESTING
Information Patent Grant
Electrical overstress detection device
- Patent number 10,677,822
- Issue date Jun 9, 2020
- Analog Devices Global Unlimited Company
- David J. Clarke
- G01 - MEASURING TESTING
Information Patent Grant
Electrical overstress reporting
- Patent number 10,557,881
- Issue date Feb 11, 2020
- Analog Devices Global
- Alan J. O'Donnell
- G08 - SIGNALLING
Information Patent Grant
Systems, circuits and methods for determining a position of a movab...
- Patent number 10,551,215
- Issue date Feb 4, 2020
- Analog Devices Global Unlimited Company
- Eoin E. English
- G01 - MEASURING TESTING
Information Patent Grant
Modules and methods including magnetic sensing structures
- Patent number 10,429,456
- Issue date Oct 1, 2019
- Analog Devices Global
- Alan J. O'Donnell
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Wear-out monitor device
- Patent number 10,365,322
- Issue date Jul 30, 2019
- Analog Devices Global
- Edward John Coyne
- G01 - MEASURING TESTING
Information Patent Grant
Wear-out monitor device
- Patent number 10,338,132
- Issue date Jul 2, 2019
- Analog Devices Global
- Edward John Coyne
- G01 - MEASURING TESTING
Information Patent Grant
Devices, systems and methods including magnetic structures
- Patent number 10,145,906
- Issue date Dec 4, 2018
- Analog Devices Global
- Alan J. O'Donnell
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Electrical overstress recording and/or harvesting
- Patent number 9,871,373
- Issue date Jan 16, 2018
- Analog Devices Global
- Alan J. O'Donnell
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Vertically integrated systems
- Patent number 9,513,246
- Issue date Dec 6, 2016
- Analog Devices, Inc.
- Alan J. O'Donnell
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Vertically integrated systems
- Patent number 9,267,915
- Issue date Feb 23, 2016
- Analog Devices, Inc.
- Alan J. O'Donnell
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Vertically integrated systems
- Patent number 9,041,150
- Issue date May 26, 2015
- Analog Devices, Inc.
- Alan J. O'Donnell
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Vertically integrated systems
- Patent number 8,957,497
- Issue date Feb 17, 2015
- Analog Devices, Inc.
- Alan J. O'Donnell
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Vertically integrated systems
- Patent number 8,890,286
- Issue date Nov 18, 2014
- Analog Devices, Inc.
- Alan J. O'Donnell
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Vertically integrated systems
- Patent number 8,890,285
- Issue date Nov 18, 2014
- Analog Devices, Inc.
- Alan J. O'Donnell
- B81 - MICRO-STRUCTURAL TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
THERMAL CYCLE DETECTORS
- Publication number 20240159596
- Publication date May 16, 2024
- Analog Devices International Unlimited Company
- Edward Coyne
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WEARABLE DEVICE WITH ENERGY HARVESTING
- Publication number 20240159804
- Publication date May 16, 2024
- Analog Devices International Unlimited Company
- David J. Clarke
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MAGNETICALLY SENSITIVE PARTICLES AND MAGNETIC STRUCTURE
- Publication number 20240085500
- Publication date Mar 14, 2024
- Analog Devices International Unlimited Company
- Alan J. O'Donnell
- G01 - MEASURING TESTING
Information Patent Application
FORCE DETECTION BASED ON PROFILE OF MAGNETICALLY SENSITIVE MATERIAL
- Publication number 20240044725
- Publication date Feb 8, 2024
- Analog Devices International Unlimited Company
- Alan J. O'Donnell
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Application
FORCE DETECTION BASED ON POSITION AND/OR MOVEMENT OF MAGNETICALLY S...
- Publication number 20240044726
- Publication date Feb 8, 2024
- Analog Devices International Unlimited Company
- Alan J. O'Donnell
- G01 - MEASURING TESTING
Information Patent Application
APPARATUSES AND METHODS FOR IMPLEMENTING DIGITAL LEDGERS VIA PHASE...
- Publication number 20240003753
- Publication date Jan 4, 2024
- Alan O'DONNELL
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
APPARATUSES AND METHODS FOR TEMPERATURE DETECTION USING PRESSURE SE...
- Publication number 20240003755
- Publication date Jan 4, 2024
- Analog Devices International Unlimited Company
- Alan O'Donnell
- G01 - MEASURING TESTING
Information Patent Application
APPARATUSES AND METHODS FOR TEMPERATURE DETECTION USING PHASE CHANG...
- Publication number 20240003752
- Publication date Jan 4, 2024
- Analog Devices International Unlimited Company
- Alan ODONNELL
- G01 - MEASURING TESTING
Information Patent Application
APPARATUSES AND METHODS FOR TEMPERATURE DETECTION USING ELECTRICAL...
- Publication number 20240003756
- Publication date Jan 4, 2024
- Analog Devices International Unlimited Company
- Alan O'Donnell
- G01 - MEASURING TESTING
Information Patent Application
APPARATUSES AND METHODS FOR OPTICAL OR VISUAL DETECTION OF TEMPERAT...
- Publication number 20240003754
- Publication date Jan 4, 2024
- Analog Devices International Unlimited Company
- Alan O'Donnell
- G01 - MEASURING TESTING
Information Patent Application
FLOW ADJUSTMENT BASED ON PARTICLE MOVEMENT IN RESPONSE TO MAGNETIC...
- Publication number 20230383855
- Publication date Nov 30, 2023
- Analog Devices International Unlimited Company
- Alan J. O'Donnell
- B08 - CLEANING
Information Patent Application
SPARK GAP STRUCTURES FOR DETECTION AND PROTECTION AGAINST ELECTRICA...
- Publication number 20230375600
- Publication date Nov 23, 2023
- Analog Devices International Unlimited Company
- David J. Clarke
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
EXPOSURE MONITOR DEVICE
- Publication number 20230366924
- Publication date Nov 16, 2023
- Analog Devices International Unlimited Company
- Edward John Coyne
- G01 - MEASURING TESTING
Information Patent Application
COMPARATIVE MEASUREMENT USING PARTICLES WITHIN ONE OR MORE COMPARTM...
- Publication number 20230349987
- Publication date Nov 2, 2023
- Analog Devices International Unlimited Company
- Alan J. O'Donnell
- G01 - MEASURING TESTING
Information Patent Application
REFERENCE ELECTRODES OF ELECTROCHEMICAL SENSORS
- Publication number 20230304958
- Publication date Sep 28, 2023
- Analog Devices International Unlimited Company
- Alfonso BERDUQUE
- G01 - MEASURING TESTING
Information Patent Application
REFERENCE ELECTRODES OF ELECTROCHEMICAL SENSORS
- Publication number 20230304956
- Publication date Sep 28, 2023
- Analog Devices International Unlimited Company
- Alfonso Berduque
- G01 - MEASURING TESTING
Information Patent Application
REFERENCE ELECTRODES OF ELECTROCHEMICAL SENSORS
- Publication number 20230304957
- Publication date Sep 28, 2023
- Analog Devices International Unlimited Company
- Alfonso BERDUQUE
- G01 - MEASURING TESTING
Information Patent Application
PARTICLE MOVEMENT IN CHANNEL RESPONSIVE TO MAGNETIC FIELD
- Publication number 20230264198
- Publication date Aug 24, 2023
- Analog Devices International Unlimited Company
- Alan J. O'Donnell
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
SYSTEMS AND METHODS FOR CHARGE STORAGE AND PROVIDING POWER
- Publication number 20230221360
- Publication date Jul 13, 2023
- Analog Devices International Unlimited Company
- Alan J. O'Donnell
- G08 - SIGNALLING
Information Patent Application
TEMPERATURE SENSING WITH PARTICLES IN MEDIUM MATERIAL
- Publication number 20230152166
- Publication date May 18, 2023
- Analog Devices International Unlimited Company
- Alan J. O'Donnell
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC FIELD SENSING BASED ON PARTICLE POSITION WITHIN CONTAINER
- Publication number 20230098962
- Publication date Mar 30, 2023
- Analog Devices International Unlimited Company
- Alan J. O'Donnell
- G01 - MEASURING TESTING
Information Patent Application
EXPOSURE MONITOR DEVICE
- Publication number 20220252664
- Publication date Aug 11, 2022
- Analog Devices International Unlimited Company
- Edward John Coyne
- G01 - MEASURING TESTING
Information Patent Application
3-AXIS ANGULAR ACCELEROMETER
- Publication number 20220155336
- Publication date May 19, 2022
- Analog Devices, Inc.
- Xin Zhang
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
CHARGE STORAGE WITH ELECTRICAL OVERSTRESS PROTECTION
- Publication number 20220082605
- Publication date Mar 17, 2022
- Analog Devices International Unlimited Company
- Alan J. O'Donnell
- G08 - SIGNALLING
Information Patent Application
DEVICES, SYSTEMS AND METHODS INCLUDING MAGNETIC STRUCTURES
- Publication number 20210405130
- Publication date Dec 30, 2021
- ANALOG DEVICES GLOBAL
- Alan J. O'Donnell
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
SPARK GAP STRUCTURES FOR DETECTION AND PROTECTION AGAINST ELECTRICA...
- Publication number 20210396788
- Publication date Dec 23, 2021
- Analog Devices International Unlimited Company
- David J. Clarke
- G01 - MEASURING TESTING
Information Patent Application
WEAR-OUT MONITOR DEVICE
- Publication number 20210088580
- Publication date Mar 25, 2021
- ANALOG DEVICES GLOBAL
- Edward John Coyne
- G01 - MEASURING TESTING
Information Patent Application
OPTICALLY ISOLATED MICROMACHINED (MEMS) SWITCHES AND RELATED METHODS
- Publication number 20210067160
- Publication date Mar 4, 2021
- Analog Devices Global Unlimited Company
- Ying Zhao
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
ELECTRICAL OVERSTRESS DETECTION DEVICE
- Publication number 20200400725
- Publication date Dec 24, 2020
- Analog Devices Global Unlimited Company
- David J. Clarke
- G01 - MEASURING TESTING
Information Patent Application
3-AXIS ANGULAR ACCELEROMETER
- Publication number 20200241036
- Publication date Jul 30, 2020
- Analog Devices, Inc.
- Xin Zhang
- B81 - MICRO-STRUCTURAL TECHNOLOGY

Alan J. O'DONNELL

Person

Patents Grantslast 30 patents

Exposure monitor device

Magnetic field sensing based on particle position within container

Exposure monitor device

Spark gap structures for detection and protection against electrica...

Devices, systems and methods including magnetic structures and micr...

Charge storage with electrical overstress protection

Electrical overstress detection device

3-axis angular accelerometer

Exposure monitor device

System comprising a package having optically isolated micromachined...

Storing charge associated with electrical overstress

Mounting structures for integrated device packages

Spark gap structures for detection and protection against electrica...

Magnetic device with magnetic structure and micro-fluidic structure

Optically isolated micromachined (MEMS) switches and related method...

Wear-out monitor device

Electrical overstress detection device

Electrical overstress reporting

Systems, circuits and methods for determining a position of a movab...

Modules and methods including magnetic sensing structures

Wear-out monitor device

Wear-out monitor device

Devices, systems and methods including magnetic structures

Electrical overstress recording and/or harvesting

Vertically integrated systems

Vertically integrated systems

Vertically integrated systems

Vertically integrated systems

Vertically integrated systems

Vertically integrated systems

Patents Applicationslast 30 patents

THERMAL CYCLE DETECTORS

WEARABLE DEVICE WITH ENERGY HARVESTING

MAGNETICALLY SENSITIVE PARTICLES AND MAGNETIC STRUCTURE

FORCE DETECTION BASED ON PROFILE OF MAGNETICALLY SENSITIVE MATERIAL

FORCE DETECTION BASED ON POSITION AND/OR MOVEMENT OF MAGNETICALLY S...

APPARATUSES AND METHODS FOR IMPLEMENTING DIGITAL LEDGERS VIA PHASE...

APPARATUSES AND METHODS FOR TEMPERATURE DETECTION USING PRESSURE SE...

APPARATUSES AND METHODS FOR TEMPERATURE DETECTION USING PHASE CHANG...

APPARATUSES AND METHODS FOR TEMPERATURE DETECTION USING ELECTRICAL...

APPARATUSES AND METHODS FOR OPTICAL OR VISUAL DETECTION OF TEMPERAT...

FLOW ADJUSTMENT BASED ON PARTICLE MOVEMENT IN RESPONSE TO MAGNETIC...

SPARK GAP STRUCTURES FOR DETECTION AND PROTECTION AGAINST ELECTRICA...

EXPOSURE MONITOR DEVICE

COMPARATIVE MEASUREMENT USING PARTICLES WITHIN ONE OR MORE COMPARTM...

REFERENCE ELECTRODES OF ELECTROCHEMICAL SENSORS

REFERENCE ELECTRODES OF ELECTROCHEMICAL SENSORS

REFERENCE ELECTRODES OF ELECTROCHEMICAL SENSORS

PARTICLE MOVEMENT IN CHANNEL RESPONSIVE TO MAGNETIC FIELD

SYSTEMS AND METHODS FOR CHARGE STORAGE AND PROVIDING POWER

TEMPERATURE SENSING WITH PARTICLES IN MEDIUM MATERIAL

MAGNETIC FIELD SENSING BASED ON PARTICLE POSITION WITHIN CONTAINER

EXPOSURE MONITOR DEVICE

3-AXIS ANGULAR ACCELEROMETER

CHARGE STORAGE WITH ELECTRICAL OVERSTRESS PROTECTION

DEVICES, SYSTEMS AND METHODS INCLUDING MAGNETIC STRUCTURES

SPARK GAP STRUCTURES FOR DETECTION AND PROTECTION AGAINST ELECTRICA...

WEAR-OUT MONITOR DEVICE

OPTICALLY ISOLATED MICROMACHINED (MEMS) SWITCHES AND RELATED METHODS

ELECTRICAL OVERSTRESS DETECTION DEVICE

3-AXIS ANGULAR ACCELEROMETER