Alan J. Weger

Person

Yorktown Heights, NY, US

People

Patents Grantslast 30 patents

Information Patent Grant
Detection of performance degradation in integrated circuits
- Patent number 11,105,856
- Issue date Aug 31, 2021
- International Business Machines Corporation
- Emily A. Ray
- G01 - MEASURING TESTING
Information Patent Grant
Scan chain latch design that improves testability of integrated cir...
- Patent number 10,571,520
- Issue date Feb 25, 2020
- Internatioanl Business Machines Corporation
- Dzmitry S. Maliuk
- G01 - MEASURING TESTING
Information Patent Grant
Non-destructive analysis to determine use history of processor
- Patent number 10,552,278
- Issue date Feb 4, 2020
- International Business Machines Corporation
- Keith A. Jenkins
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Detection of hardware trojan using light emissions with sacrificial...
- Patent number 10,147,175
- Issue date Dec 4, 2018
- International Business Machines Corporation
- Andrea Bahgat Shehata
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Non-destructive analysis to determine use history of processor
- Patent number 10,102,090
- Issue date Oct 16, 2018
- International Business Machines Corporation
- Keith A. Jenkins
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Minimum-spacing circuit design and layout for PICA
- Patent number 9,930,325
- Issue date Mar 27, 2018
- International Business Machines Corporation
- Herschel A. Ainspan
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Scan chain latch design that improves testability of integrated cir...
- Patent number 9,678,152
- Issue date Jun 13, 2017
- International Business Machines Corporation
- Dzmitry S. Maliuk
- G01 - MEASURING TESTING
Information Patent Grant
Scan chain latch design that improves testability of integrated cir...
- Patent number 9,372,231
- Issue date Jun 21, 2016
- International Business Machines Corporation
- Dzmitry S. Maliuk
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for probing a wafer
- Patent number 9,310,429
- Issue date Apr 12, 2016
- GLOBALFOUNDRIES Inc.
- Stephen Bradley Ippolito
- G01 - MEASURING TESTING
Information Patent Grant
Scan chain latch design that improves testability of integrated cir...
- Patent number 9,261,561
- Issue date Feb 16, 2016
- International Business Machines Corporation
- Dzmitry S. Maliuk
- G01 - MEASURING TESTING
Information Patent Grant
Minimum-spacing circuit design and layout for PICA
- Patent number 9,229,044
- Issue date Jan 5, 2016
- International Business Machines Corporation
- Herschel A. Ainspan
- G01 - MEASURING TESTING
Information Patent Grant
Scan chain latch design that improves testability of integrated cir...
- Patent number 9,086,457
- Issue date Jul 21, 2015
- International Business Machines Corporation
- Dzmitry Maliuk
- G01 - MEASURING TESTING
Information Patent Grant
Minimum-spacing circuit design and layout for PICA
- Patent number 9,081,049
- Issue date Jul 14, 2015
- International Business Machines Corporation
- Herschel A. Ainspan
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for probing a wafer
- Patent number 8,248,097
- Issue date Aug 21, 2012
- International Business Machines Corporation
- Stephen Bradley Ippolito
- G01 - MEASURING TESTING
Information Patent Grant
Constructing variability maps by correlating off-state leakage emis...
- Patent number 8,131,056
- Issue date Mar 6, 2012
- International Business Machines Corporation
- Stanislav Polonsky
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of virtualization and OS-level thermal management and multit...
- Patent number 7,886,172
- Issue date Feb 8, 2011
- International Business Machines Corporation
- Pradip Bose
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Method and apparatus for diagnosing broken scan chain based on leak...
- Patent number 7,788,058
- Issue date Aug 31, 2010
- International Business Machines Corporation
- Peilin Song
- G01 - MEASURING TESTING
Information Patent Grant
Techniques for distributing power in electronic circuits and comput...
- Patent number 7,698,114
- Issue date Apr 13, 2010
- International Business Machines Corporation
- Hendrik F. Hamann
- G01 - MEASURING TESTING
Information Patent Grant
Equivalent gate count yield estimation for integrated circuit devices
- Patent number 7,477,961
- Issue date Jan 13, 2009
- International Business Machines Corporation
- Thomas S. Barnett
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Enhanced signal observability for circuit analysis
- Patent number 7,446,550
- Issue date Nov 4, 2008
- International Business Machines Corporation
- Chandler Todd McDowell
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for diagnosing broken scan chain based on leak...
- Patent number 7,426,448
- Issue date Sep 16, 2008
- International Business Machines Corporation
- Peilin Song
- G01 - MEASURING TESTING
Information Patent Grant
Enhanced signal observability for circuit analysis
- Patent number 7,355,419
- Issue date Apr 8, 2008
- International Business Machines Corporation
- Chandler Todd McDowell
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for measuring temperature and power distribution...
- Patent number 7,167,806
- Issue date Jan 23, 2007
- International Business Machines Corporation
- Hendrik F. Hamann
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for improved detection of multisynchronous sig...
- Patent number 6,963,811
- Issue date Nov 8, 2005
- International Business Machines Corporation
- Alan J. Weger
- G01 - MEASURING TESTING
Information Patent Grant
Method and application of PICA (picosecond imaging circuit analysis...
- Patent number 6,943,578
- Issue date Sep 13, 2005
- International Business Machines Corporation
- Naoko Pia Sanda
- G01 - MEASURING TESTING
Information Patent Grant
Analysis methods of leakage current luminescence in CMOS circuits
- Patent number 6,909,295
- Issue date Jun 21, 2005
- International Business Machines Corporation
- Stanislav V. Polonsky
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DETECTION OF PERFORMANCE DEGRADATION IN INTEGRATED CIRCUITS
- Publication number 20200150181
- Publication date May 14, 2020
- International Business Machines Corporation
- Emily A. Ray
- G01 - MEASURING TESTING
Information Patent Application
NON-DESTRUCTIVE ANALYSIS TO DETERMINE USE HISTORY OF PROCESSOR
- Publication number 20180322025
- Publication date Nov 8, 2018
- International Business Machines Corporation
- Keith A. Jenkins
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DETECTION OF HARDWARE TROJAN USING LIGHT EMISSIONS WITH SACRIFICIAL...
- Publication number 20180211377
- Publication date Jul 26, 2018
- International Business Machines Corporation
- Andrea Bahgat Shehata
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INTEGRATED CIRCUIT TEMPERATURE DETERMINATION USING PHOTON EMISSION...
- Publication number 20180100891
- Publication date Apr 12, 2018
- International Business Machines Corporation
- Franco Stellari
- G01 - MEASURING TESTING
Information Patent Application
NON-DESTRUCTIVE ANALYSIS TO DETERMINE USE HISTORY OF PROCESSOR
- Publication number 20170329685
- Publication date Nov 16, 2017
- International Business Machines Corporation
- Keith A. Jenkins
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SCAN CHAIN LATCH DESIGN THAT IMPROVES TESTABILITY OF INTEGRATED CIR...
- Publication number 20170242073
- Publication date Aug 24, 2017
- International Business Machines Corporation
- Dzmitry S. Maliuk
- G01 - MEASURING TESTING
Information Patent Application
SCAN CHAIN LATCH DESIGN THAT IMPROVES TESTABILITY OF INTEGRATED CIR...
- Publication number 20170097389
- Publication date Apr 6, 2017
- International Business Machines Corporation
- Dzmitry S. Maliuk
- G01 - MEASURING TESTING
Information Patent Application
MINIMUM-SPACING CIRCUIT DESIGN AND LAYOUT FOR PICA
- Publication number 20160150227
- Publication date May 26, 2016
- International Business Machines Corporation
- HERSCHEL A. AINSPAN
- G01 - MEASURING TESTING
Information Patent Application
SCAN CHAIN LATCH DESIGN THAT IMPROVES TESTABILITY OF INTEGRATED CIR...
- Publication number 20160116534
- Publication date Apr 28, 2016
- International Business Machines Corporation
- Dzmitry S. Maliuk
- G01 - MEASURING TESTING
Information Patent Application
SCAN CHAIN LATCH DESIGN THAT IMPROVES TESTABILITY OF INTEGRATED CIR...
- Publication number 20160003902
- Publication date Jan 7, 2016
- International Business Machines Corporation
- Dzmitry S. Maliuk
- G01 - MEASURING TESTING
Information Patent Application
SCAN CHAIN LATCH DESIGN THAT IMPROVES TESTABILITY OF INTEGRATED CIR...
- Publication number 20140298128
- Publication date Oct 2, 2014
- International Business Machines Corporation
- Dzmitry Maliuk
- G01 - MEASURING TESTING
Information Patent Application
MINIMUM-SPACING CIRCUIT DESIGN AND LAYOUT FOR PICA
- Publication number 20140176183
- Publication date Jun 26, 2014
- International Business Machines Corporation
- HERSCHEL A. AINSPAN
- G01 - MEASURING TESTING
Information Patent Application
MINIMUM-SPACING CIRCUIT DESIGN AND LAYOUT FOR PICA
- Publication number 20130280828
- Publication date Oct 24, 2013
- International Business Machines Corporation
- HERSCHEL A. AINSPAN
- G01 - MEASURING TESTING
Information Patent Application
MINIMUM-SPACING CIRCUIT DESIGN AND LAYOUT FOR PICA
- Publication number 20130278285
- Publication date Oct 24, 2013
- International Business Machines Corporation
- HERSCHEL A. AINSPAN
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR PROBING A WAFER
- Publication number 20120217974
- Publication date Aug 30, 2012
- International Business Machines Corporation
- Stephen Bradley Ippolito
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus for Probing a Wafer
- Publication number 20100253379
- Publication date Oct 7, 2010
- Stephen Bradley Ippolito
- G01 - MEASURING TESTING
Information Patent Application
Constructing Variability Maps by Correlating Off-State Leakage Emis...
- Publication number 20100080445
- Publication date Apr 1, 2010
- Stanislav Polonsky
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
EQUIVALENT GATE COUNT YIELD ESTIMATION FOR INTEGRATED CIRCUIT DEVICES
- Publication number 20090112352
- Publication date Apr 30, 2009
- International Business Machines Corporation
- Thomas S. Barnett
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF VIRTUALIZATION AND OS-LEVEL THERMAL MANAGEMENT AND MULTIT...
- Publication number 20090064164
- Publication date Mar 5, 2009
- Pradip Bose
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND APPARATUS FOR DIAGNOSING BROKEN SCAN CHAIN BASED ON LEAK...
- Publication number 20080208507
- Publication date Aug 28, 2008
- PEILIN SONG
- G01 - MEASURING TESTING
Information Patent Application
ENHANCED SIGNAL OBSERVABILITY FOR CIRCUIT ANALYSIS
- Publication number 20080079448
- Publication date Apr 3, 2008
- International Business Machines Corporation
- Chandler Todd McDowell
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR IMPROVED EQUIVALENT GATE COUNT YIELD ESTIMATION FOR INTE...
- Publication number 20070265722
- Publication date Nov 15, 2007
- International Business Machines Corporation
- Thomas S. Barnett
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Techniques for distributing power in electronic circuits and comput...
- Publication number 20070098037
- Publication date May 3, 2007
- International Business Machines Corporation
- Hendrik F. Hamann
- G01 - MEASURING TESTING
Information Patent Application
Method and system for measuring temperature and power distributions...
- Publication number 20060039114
- Publication date Feb 23, 2006
- International Business Machines Corporation
- Hendrik F. Hamann
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Enhanced signal observability for circuit analysis
- Publication number 20060028219
- Publication date Feb 9, 2006
- International Business Machines Corporation
- Chandler Todd McDowell
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPLICATION OF PICA (PICOSECOND IMAGING CIRCUIT ANALYSIS...
- Publication number 20050218921
- Publication date Oct 6, 2005
- International Business Machines Corporation
- Naoko Pia Sanda
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for diagnosing broken scan chain based on leak...
- Publication number 20050168228
- Publication date Aug 4, 2005
- International Business Machines Corporation
- Peilin Song
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for improved detection of multisynchronous sig...
- Publication number 20050071100
- Publication date Mar 31, 2005
- International Business Machines Corporation
- Alan J. Weger
- G01 - MEASURING TESTING
Information Patent Application
Analysis methods of leakage current luminescence in CMOS circuits
- Publication number 20050062490
- Publication date Mar 24, 2005
- International Business Machines Corporation
- Stanislav V. Polonsky
- G01 - MEASURING TESTING

Alan J. Weger

Person

Patents Grantslast 30 patents

Detection of performance degradation in integrated circuits

Scan chain latch design that improves testability of integrated cir...

Non-destructive analysis to determine use history of processor

Detection of hardware trojan using light emissions with sacrificial...

Non-destructive analysis to determine use history of processor

Minimum-spacing circuit design and layout for PICA

Scan chain latch design that improves testability of integrated cir...

Scan chain latch design that improves testability of integrated cir...

Method and apparatus for probing a wafer

Scan chain latch design that improves testability of integrated cir...

Minimum-spacing circuit design and layout for PICA

Scan chain latch design that improves testability of integrated cir...

Minimum-spacing circuit design and layout for PICA

Method and apparatus for probing a wafer

Constructing variability maps by correlating off-state leakage emis...

Method of virtualization and OS-level thermal management and multit...

Method and apparatus for diagnosing broken scan chain based on leak...

Techniques for distributing power in electronic circuits and comput...

Equivalent gate count yield estimation for integrated circuit devices

Enhanced signal observability for circuit analysis

Method and apparatus for diagnosing broken scan chain based on leak...

Enhanced signal observability for circuit analysis

Method and system for measuring temperature and power distribution...

Method and apparatus for improved detection of multisynchronous sig...

Method and application of PICA (picosecond imaging circuit analysis...

Analysis methods of leakage current luminescence in CMOS circuits

Patents Applicationslast 30 patents

DETECTION OF PERFORMANCE DEGRADATION IN INTEGRATED CIRCUITS

NON-DESTRUCTIVE ANALYSIS TO DETERMINE USE HISTORY OF PROCESSOR

DETECTION OF HARDWARE TROJAN USING LIGHT EMISSIONS WITH SACRIFICIAL...

INTEGRATED CIRCUIT TEMPERATURE DETERMINATION USING PHOTON EMISSION...

NON-DESTRUCTIVE ANALYSIS TO DETERMINE USE HISTORY OF PROCESSOR

SCAN CHAIN LATCH DESIGN THAT IMPROVES TESTABILITY OF INTEGRATED CIR...

SCAN CHAIN LATCH DESIGN THAT IMPROVES TESTABILITY OF INTEGRATED CIR...

MINIMUM-SPACING CIRCUIT DESIGN AND LAYOUT FOR PICA

SCAN CHAIN LATCH DESIGN THAT IMPROVES TESTABILITY OF INTEGRATED CIR...

SCAN CHAIN LATCH DESIGN THAT IMPROVES TESTABILITY OF INTEGRATED CIR...

SCAN CHAIN LATCH DESIGN THAT IMPROVES TESTABILITY OF INTEGRATED CIR...

MINIMUM-SPACING CIRCUIT DESIGN AND LAYOUT FOR PICA

MINIMUM-SPACING CIRCUIT DESIGN AND LAYOUT FOR PICA

MINIMUM-SPACING CIRCUIT DESIGN AND LAYOUT FOR PICA

METHOD AND APPARATUS FOR PROBING A WAFER

Method and Apparatus for Probing a Wafer

Constructing Variability Maps by Correlating Off-State Leakage Emis...

EQUIVALENT GATE COUNT YIELD ESTIMATION FOR INTEGRATED CIRCUIT DEVICES

METHOD OF VIRTUALIZATION AND OS-LEVEL THERMAL MANAGEMENT AND MULTIT...

METHOD AND APPARATUS FOR DIAGNOSING BROKEN SCAN CHAIN BASED ON LEAK...

ENHANCED SIGNAL OBSERVABILITY FOR CIRCUIT ANALYSIS

METHOD FOR IMPROVED EQUIVALENT GATE COUNT YIELD ESTIMATION FOR INTE...

Techniques for distributing power in electronic circuits and comput...

Method and system for measuring temperature and power distributions...

Enhanced signal observability for circuit analysis

METHOD AND APPLICATION OF PICA (PICOSECOND IMAGING CIRCUIT ANALYSIS...

Method and apparatus for diagnosing broken scan chain based on leak...

Method and apparatus for improved detection of multisynchronous sig...

Analysis methods of leakage current luminescence in CMOS circuits