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Alan L. Blitz
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Newton, MA, US
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Patents Grants
last 30 patents
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Patent Grant
Automatic test system with easily modified software
Patent number
7,171,587
Issue date
Jan 30, 2007
Teradyne, Inc.
Stephen J. Hlotyak
G01 - MEASURING TESTING
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Patent Grant
System for storing and searching named device parameter data in a t...
Patent number
6,047,293
Issue date
Apr 4, 2000
Teradyne, Inc.
Alan L. Blitz
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
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Patent Application
Automatic test system with easily modified software
Publication number
20040215361
Publication date
Oct 28, 2004
Stephen J. Hlotyak
G01 - MEASURING TESTING