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Alan Moore
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Phoenix, AZ, US
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last 30 patents
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Patent Grant
Test access architecture for testing of circuits modules at an inte...
Patent number
5,604,432
Issue date
Feb 18, 1997
Intel Corporation
Alan Moore
G01 - MEASURING TESTING
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Patent Grant
Apparatus for a test access architecture for testing of modules wit...
Patent number
5,534,774
Issue date
Jul 9, 1996
Intel Corporation
Alan Moore
G01 - MEASURING TESTING