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Alan Nolet
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San Jose, CA, US
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last 30 patents
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Patent Grant
Controlling critical dimensions of structures formed on a wafer in...
Patent number
7,566,181
Issue date
Jul 28, 2009
Tokyo Electron Limited
Wenge Yang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Modeling and measuring structures with spatially varying properties...
Patent number
7,515,282
Issue date
Apr 7, 2009
Timbre Technologies, Inc.
Shifang Li
G01 - MEASURING TESTING
Information
Patent Grant
Optimized characterization of wafers structures for optical metrology
Patent number
7,444,196
Issue date
Oct 28, 2008
Timbre Technologies, Inc.
Steven Scheer
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
Optimized characterization of wafers structures for optical metrology
Publication number
20070250200
Publication date
Oct 25, 2007
Timbre Technologies, Inc.
Steven Scheer
G01 - MEASURING TESTING
Information
Patent Application
Modeling and measuring structures with spatially varying properties...
Publication number
20070002337
Publication date
Jan 4, 2007
Timbre Technologies, Inc.
Shifang Li
G01 - MEASURING TESTING
Information
Patent Application
Controlling critical dimensions of structures formed on a wafer in...
Publication number
20060046166
Publication date
Mar 2, 2006
Timbre Technologies, Inc.
Wenge Yang
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY