Alan R. Humphrey

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St. Albans, VT, US

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Patents Grantslast 30 patents

Information Patent Grant
Method for optimizing a set of scan diagnostic patterns
- Patent number 6,996,791
- Issue date Feb 7, 2006
- International Business Machines Corporation
- Vanessa Brunkhorst
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR OPTIMIZING A SET OF SCAN DIAGNOSTIC PATTERNS
- Publication number 20050114747
- Publication date May 26, 2005
- International Business Machines Corporation
- Vanessa Brunkhorst
- G01 - MEASURING TESTING