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Alan T. Teruya
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Livermore, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Angled slit design for computed tomographic imaging of electron beams
Patent number
10,888,284
Issue date
Jan 12, 2021
Lawrence Livermore National Security, LLC
John W. Elmer
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Concentric semi-circular split profiling for computed tomographic i...
Patent number
10,649,102
Issue date
May 12, 2020
Lawrence Livermore National Security, LLC
John W. Elmer
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Electron beam diagnostic system using computed tomography and an an...
Patent number
9,105,448
Issue date
Aug 11, 2015
Lawrence Livermore National Security, LLC
John W. Elmer
G01 - MEASURING TESTING
Information
Patent Grant
Electron beam diagnostic system using computed tomography and an an...
Patent number
8,791,426
Issue date
Jul 29, 2014
Lawrence Livermore National Security, LLC
John W. Elmer
G01 - MEASURING TESTING
Information
Patent Grant
Slit disk for modified faraday cup diagnostic for determining power...
Patent number
7,902,503
Issue date
Mar 8, 2011
Lawrence Livermore National Security, LLC
Alan T. Teruya
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Miniature modified Faraday cup for micro electron beams
Patent number
7,378,830
Issue date
May 27, 2008
Lawrence Livermore National Security, LLC
Alan T. Teruya
G01 - MEASURING TESTING
Information
Patent Grant
Electron beam diagnostic for profiling high power beams
Patent number
7,348,568
Issue date
Mar 25, 2008
Lawrence Livermore Natonal Security, LLC
John W. Elmer
G01 - MEASURING TESTING
Information
Patent Grant
Diagnostic system for profiling micro-beams
Patent number
7,288,772
Issue date
Oct 30, 2007
The Regents of the University of California
John W. Elmer
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Trigger probe for determining the orientation of the power distribu...
Patent number
7,244,950
Issue date
Jul 17, 2007
The Regents of the University of California
John W. Elmer
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Enhanced modified faraday cup for determination of power density di...
Patent number
6,300,755
Issue date
Oct 9, 2001
Regents of the University of California
John W. Elmer
G01 - MEASURING TESTING
Information
Patent Grant
Tomographic determination of the power distribution in electron beams
Patent number
5,583,427
Issue date
Dec 10, 1996
Regents of the University of California
Alan T. Teruya
G01 - MEASURING TESTING
Information
Patent Grant
Modified Faraday cup
Patent number
5,554,926
Issue date
Sep 10, 1996
Regents of the University of California
John W. Elmer
G01 - MEASURING TESTING
Information
Patent Grant
System for tomographic determination of the power distribution in e...
Patent number
5,468,966
Issue date
Nov 21, 1995
Regents of the University of California
John W. Elmer
G01 - MEASURING TESTING
Information
Patent Grant
System for tomographic determination of the power distribution in e...
Patent number
5,382,895
Issue date
Jan 17, 1995
Regents of the University of California
John W. Elmer
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
ANGLED SLIT DESIGN FOR COMPUTED TOMOGRAPHIC IMAGING OF ELECTRON BEAMS
Publication number
20200297290
Publication date
Sep 24, 2020
LAWRENCE LIVERMORE NATIONAL SECURITY, LLC
John W. Elmer
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Application
CONCENTRIC SEMI-CIRCULAR SPLIT PROFILING FOR COMPUTED TOMOGRAPHIC I...
Publication number
20200081143
Publication date
Mar 12, 2020
LAWRENCE LIVERMORE NATIONAL SECURITY, LLC
John W. Elmer
G01 - MEASURING TESTING
Information
Patent Application
ELECTRON BEAM DIAGNOSTIC SYSTEM USING COMPUTED TOMOGRAPHY AND AN AN...
Publication number
20150001416
Publication date
Jan 1, 2015
Lawrence Livermore National Security, LLC
John W. Elmer
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ELECTRON BEAM DIAGNOSTIC SYSTEM USING COMPUTED TOMOGRAPHY AND AN AN...
Publication number
20110121180
Publication date
May 26, 2011
John W. Elmer
G01 - MEASURING TESTING
Information
Patent Application
Slit Disk for Modified Faraday Cup Diagnostic for Determing Power D...
Publication number
20100032562
Publication date
Feb 11, 2010
Alan T. Teruya
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MINIATURE MODIFIED FARADAY CUP FOR MICRO ELECTRON BEAMS
Publication number
20080088295
Publication date
Apr 17, 2008
The Regents of the University of California.
Alan T. Teruya
G01 - MEASURING TESTING
Information
Patent Application
Automatic focusing of electron beams using a modified Faraday cup d...
Publication number
20070210041
Publication date
Sep 13, 2007
The Regents of the University of California.
John W. Elmer
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Application
Micro-joining using electron beams
Publication number
20060196853
Publication date
Sep 7, 2006
The Regents of the University of California.
John W. Elmer
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Application
Trigger probe for determining the orientation of the power distribu...
Publication number
20060038139
Publication date
Feb 23, 2006
The Regents of the University of California.
John W. Elmer
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Application
Electron beam diagnostic for profiling high power beams
Publication number
20050285047
Publication date
Dec 29, 2005
The Regents of the University of California.
John W. Elmer
G01 - MEASURING TESTING
Information
Patent Application
Diagnostic system for profiling micro-beams
Publication number
20050242299
Publication date
Nov 3, 2005
The Regents of the University of California.
John W. Elmer
H01 - BASIC ELECTRIC ELEMENTS