Aland K. Chin

Person

Union County, NJ, US

People

Patents Grantslast 30 patents

Information Patent Grant
Coating for optical devices
- Patent number 4,749,255
- Issue date Jun 7, 1988
- American Telephone and Telegraph Company, AT&T Bell Laboratories
- Utpal K. Chakrabarti
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Coating of III-V and II-VI compound semiconductors
- Patent number 4,634,474
- Issue date Jan 6, 1987
- AT&T Bell Laboratories
- Irfan Camlibel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Process for making optical INP devices
- Patent number 4,617,192
- Issue date Oct 14, 1986
- AT&T Bell Laboratories
- Aland K. Chin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multiple wavelength light emitting devices
- Patent number 4,605,942
- Issue date Aug 12, 1986
- AT&T Bell Laboratories
- Irfan Camlibel
- G02 - OPTICS
Information Patent Grant
Forming platinum contacts to in-based group III-V compound devices
- Patent number 4,538,342
- Issue date Sep 3, 1985
- AT&T Bell Laboratories
- Irfan Camlibel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ohmic contacts for semiconductor devices
- Patent number 4,510,514
- Issue date Apr 9, 1985
- AT&T Bell Laboratories
- Irfan Camlibel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of making p-i-n photodiodes
- Patent number 4,477,964
- Issue date Oct 23, 1984
- AT&T Bell Laboratories
- Aland K. Chin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Light emitting diode
- Patent number 4,447,822
- Issue date May 8, 1984
- Bell Telephone Laboratories, Incorporated
- Aland K. Chin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
p-i-n Photodiodes
- Patent number 4,443,809
- Issue date Apr 17, 1984
- AT&T Bell Telephone Laboratories, Incorporated
- Aland K. Chin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of analyzing localized nonuniformities in luminescing materials
- Patent number 4,238,686
- Issue date Dec 9, 1980
- Bell Telephone Laboratories, Incorporated
- Aland K. Chin
- G01 - MEASURING TESTING

Aland K. Chin

Person

Patents Grantslast 30 patents

Coating for optical devices

Coating of III-V and II-VI compound semiconductors

Process for making optical INP devices

Multiple wavelength light emitting devices

Forming platinum contacts to in-based group III-V compound devices

Ohmic contacts for semiconductor devices

Method of making p-i-n photodiodes

Light emitting diode

p-i-n Photodiodes

Method of analyzing localized nonuniformities in luminescing materials