Albert Alcorn

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Milpitas, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
High speed wafer sort and final test
- Patent number 6,777,971
- Issue date Aug 17, 2004
- LSI Logic Corporation
- Mohan Kirloskar
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
High speed wafer sort and final test
- Publication number 20030214317
- Publication date Nov 20, 2003
- Velio Communications, Inc.
- Mohan Kirloskar
- G01 - MEASURING TESTING