Albert Archwamety

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Singapore, SG

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Patents Grantslast 30 patents

Information Patent Grant
Methods of inspecting a 3D object using 2D image processing
- Patent number 10,151,580
- Issue date Dec 11, 2018
- GENERIC POWER PTD LTD
- Kok Weng Wong
- G01 - MEASURING TESTING
Information Patent Grant
System and method for inspecting a wafer
- Patent number 8,885,918
- Issue date Nov 11, 2014
- Semiconductor Technologies & Instruments Pte Ltd
- Ajharali Amanullah
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method of Color Inspection by Using Monochrome Imaging With Multipl...
- Publication number 20220159182
- Publication date May 19, 2022
- MIT SEMICONDUCTOR PTE LTD
- Kok Weng WONG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD OF OBJECT INSPECTION USING MULTISPECTRAL 3D LASER...
- Publication number 20220107174
- Publication date Apr 7, 2022
- MIT SEMICONDUCTOR PTE LTD
- Kok Weng WONG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHODS OF INSPECTING A 3D OBJECT USING 2D IMAGE PROCESSING
- Publication number 20170254639
- Publication date Sep 7, 2017
- Generic Power PTD LTD
- Kok Weng WONG
- G01 - MEASURING TESTING
Information Patent Application
System and method for inspecting a wafer
- Publication number 20100189339
- Publication date Jul 29, 2010
- Semiconductor Technologies & Instruments Pte Ltd
- Ajharali Amanullah
- G06 - COMPUTING CALCULATING COUNTING