Albert J. Lamm

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Hollister, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus for characterization of microelectronic feature quality
- Patent number 6,642,063
- Issue date Nov 4, 2003
- Lam Research Corporation
- Randall S. Mundt
- G01 - MEASURING TESTING
Information Patent Grant
Method for characterization of microelectronic feature quality
- Patent number 6,432,729
- Issue date Aug 13, 2002
- Lam Research Corporation
- Randall S. Mundt
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for control of deposit build-up on an inner surface of a...
- Patent number 6,155,203
- Issue date Dec 5, 2000
- Lam Research Corporation
- William S. Kennedy
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for control of deposit build-up on an inner su...
- Patent number 6,035,868
- Issue date Mar 14, 2000
- Lam Research Corporation
- William S. Kennedy
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for preventing lightup of gas distribution holes
- Patent number 6,033,585
- Issue date Mar 7, 2000
- Lam Research Corporation
- Thomas E. Wicker
- H01 - BASIC ELECTRIC ELEMENTS