ALBERT S. CHECKANOV

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CHANDLER, AZ, US

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Patents Applicationslast 30 patents

Information Patent Application
SYSTEM FOR WAFER-LEVEL TESTING OF MEMS PRESSURE SENSORS
- Publication number 20160116361
- Publication date Apr 28, 2016
- FREESCALE SEMICONDUCTOR, INC.
- BRUNO J. DEBEURRE
- B81 - MICRO-STRUCTURAL TECHNOLOGY