Albert Visscher

Person

Veldhoven, NL

People

Patents Grantslast 30 patents

Information Patent Grant
Electron microscope stage
- Patent number 11,244,805
- Issue date Feb 8, 2022
- FEI Company
- Albert Visscher
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle microscope with vibration detection / correction
- Patent number 9,875,879
- Issue date Jan 23, 2018
- FEI Company
- Jeroen De Boeij
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle microscope with barometric pressure correction
- Patent number 9,601,310
- Issue date Mar 21, 2017
- FEI Company
- Marco Hugo Petrus Moers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Enclosure for acoustic insulation of an apparatus contained within...
- Patent number 9,453,335
- Issue date Sep 27, 2016
- FEI Company
- Albert Visscher
- E04 - BUILDING
Information Patent Grant
Enclosure for acoustic insulation of an apparatus contained within...
- Patent number 8,170,255
- Issue date May 1, 2012
- FEI Company
- Albert Visscher
- E04 - BUILDING
Information Patent Grant
Particle-optical device for irradiating an object
- Patent number 7,091,497
- Issue date Aug 15, 2006
- FEI Company
- Albert Visscher
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Object carrier for a particle-optical apparatus
- Patent number 6,593,581
- Issue date Jul 15, 2003
- FEI Company
- Albert Visscher
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
ELECTRON MICROSCOPE STAGE
- Publication number 20210151281
- Publication date May 20, 2021
- FEI Company
- Albert Visscher
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE MICROSCOPE WITH VIBRATION DETECTION / CORRECTION
- Publication number 20170125209
- Publication date May 4, 2017
- FEI Company
- Jeroen De Boeij
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE MICROSCOPE WITH BAROMETRIC PRESSURE CORRECTION
- Publication number 20160133437
- Publication date May 12, 2016
- FEI Company
- Marco Hugo Petrus Moers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ENCLOSURE FOR ACOUSTIC INSULATION OF AN APPARATUS CONTAINED WITHIN...
- Publication number 20120195452
- Publication date Aug 2, 2012
- FEI Company
- Albert Visscher
- E04 - BUILDING
Information Patent Application
Enclosure for acoustic insulation of an apparatus contained within...
- Publication number 20070189567
- Publication date Aug 16, 2007
- FEI Company
- Albert Visscher
- E04 - BUILDING
Information Patent Application
Particle-optical device for irradiating an object
- Publication number 20040178354
- Publication date Sep 16, 2004
- FEI Company
- Albert Visscher
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Object carrier for a particle-optical apparatus
- Publication number 20010011707
- Publication date Aug 9, 2001
- Philips Electron Optics B.V.
- Albert Visscher
- H01 - BASIC ELECTRIC ELEMENTS

Albert Visscher

Person

Patents Grantslast 30 patents

Electron microscope stage

Charged particle microscope with vibration detection / correction

Charged particle microscope with barometric pressure correction

Enclosure for acoustic insulation of an apparatus contained within...

Enclosure for acoustic insulation of an apparatus contained within...

Particle-optical device for irradiating an object

Object carrier for a particle-optical apparatus

Patents Applicationslast 30 patents

ELECTRON MICROSCOPE STAGE

CHARGED PARTICLE MICROSCOPE WITH VIBRATION DETECTION / CORRECTION

CHARGED PARTICLE MICROSCOPE WITH BAROMETRIC PRESSURE CORRECTION

ENCLOSURE FOR ACOUSTIC INSULATION OF AN APPARATUS CONTAINED WITHIN...

Enclosure for acoustic insulation of an apparatus contained within...

Particle-optical device for irradiating an object

Object carrier for a particle-optical apparatus