Alberto DA COSTA ASSAFRAO

Person

Veldhoven, NL

People

Patents Grantslast 30 patents

Information Patent Grant
Methods and apparatus for monitoring a manufacturing process, inspe...
- Patent number 11,698,346
- Issue date Jul 11, 2023
- ASML Netherlands B.V.
- Ioana Sorina Barbu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of measuring a structure, inspection apparatus, lithographic...
- Patent number 11,022,892
- Issue date Jun 1, 2021
- ASML Netherlands B.V.
- Patrick Warnaar
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Metrology method, apparatus, and computer program to determine a re...
- Patent number 11,009,345
- Issue date May 18, 2021
- ASML Netherlands B.V.
- Alberto Da Costa Assafrao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Metrology method and apparatus, computer program and lithographic s...
- Patent number 10,705,437
- Issue date Jul 7, 2020
- ASML Netherlands B.V.
- Narjes Javaheri
- G01 - MEASURING TESTING
Information Patent Grant
Metrology method and apparatus and associated computer product
- Patent number 10,551,750
- Issue date Feb 4, 2020
- ASML Netherlands B.V.
- Adam Jan Urbanczyk
- G01 - MEASURING TESTING
Information Patent Grant
Method of measuring a structure, inspection apparatus, lithographic...
- Patent number 10,466,594
- Issue date Nov 5, 2019
- ASML Netherlands B.V.
- Patrick Warnaar
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Metrology method and apparatus and associated computer product
- Patent number 10,310,388
- Issue date Jun 4, 2019
- ASML Netherlands B.V.
- Adam Urbanczyk
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method of Measuring a Structure, Inspection Apparatus, Lithographic...
- Publication number 20200064744
- Publication date Feb 27, 2020
- ASML NETHERLANDS B.V.
- Patrick WARNAAR
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Metrology Method, Apparatus And Computer Program
- Publication number 20190368867
- Publication date Dec 5, 2019
- ASML NETHERLANDS B.V.
- Alberto DA COSTA ASSAFRAO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Metrology Method and Apparatus and Associated Computer Product
- Publication number 20190250520
- Publication date Aug 15, 2019
- ASML NETHERLANDS B.V.
- Adam Jan URBANCZYK
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Metrology Method and Apparatus, Computer Program and Lithographic S...
- Publication number 20190107785
- Publication date Apr 11, 2019
- ASML NETHERLANDS B.V.
- Narjes JAVAHERI
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHODS AND APPARATUS FOR MONITORING A MANUFACTURING PROCESS, INSPE...
- Publication number 20190072496
- Publication date Mar 7, 2019
- ASML NETHERLANDS B.V.
- Ioana Sorina Barbu
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Metrology Method and Apparatus and Associated Computer Product
- Publication number 20180217508
- Publication date Aug 2, 2018
- ASML NETHERLANDS B.V.
- Adam URBANCZYK
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Method of Measuring a Structure, Inspection Apparatus, Lithographic...
- Publication number 20170248852
- Publication date Aug 31, 2017
- ASML NETHERLANDS B.V.
- Patrick WARNAAR
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Alberto DA COSTA ASSAFRAO

Person

Patents Grantslast 30 patents

Methods and apparatus for monitoring a manufacturing process, inspe...

Method of measuring a structure, inspection apparatus, lithographic...

Metrology method, apparatus, and computer program to determine a re...

Metrology method and apparatus, computer program and lithographic s...

Metrology method and apparatus and associated computer product

Method of measuring a structure, inspection apparatus, lithographic...

Metrology method and apparatus and associated computer product

Patents Applicationslast 30 patents

Method of Measuring a Structure, Inspection Apparatus, Lithographic...

Metrology Method, Apparatus And Computer Program

Metrology Method and Apparatus and Associated Computer Product

Metrology Method and Apparatus, Computer Program and Lithographic S...

METHODS AND APPARATUS FOR MONITORING A MANUFACTURING PROCESS, INSPE...

Metrology Method and Apparatus and Associated Computer Product

Method of Measuring a Structure, Inspection Apparatus, Lithographic...