Alberto Fazzi

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Milano, IT

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Patents Grantslast 30 patents

Information Patent Grant
Radiation detector of the ΔE-E type with insulation trenches
- Patent number 8,183,655
- Issue date May 22, 2012
- STMicroelectronics S.r.l.
- Giuseppe Valvo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Radiation detector of the deltaE-E type with insulation trenches
- Patent number 7,847,360
- Issue date Dec 7, 2010
- STMicroelectronics, SRL
- Giuseppina Valvo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Chip-to-chip communication system and method
- Patent number 7,808,276
- Issue date Oct 5, 2010
- STMicroelectronics S.r.l.
- Luca Ciccarelli
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Measurement alignment system to determine alignment between chips
- Patent number 7,456,637
- Issue date Nov 25, 2008
- STMicroelectronics, SRL
- Roberto Canegallo
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
RADIATION DETECTOR OF THE DELTA E-E TYPE WITH INSULATION TRENCHES
- Publication number 20100148079
- Publication date Jun 17, 2010
- STMicroelectronics S.r.l.
- Giuseppe VALVO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
RADIATION DETECTOR OF THE DELTA E-E TYPE WITH INSULATION TRENCHES
- Publication number 20100140489
- Publication date Jun 10, 2010
- STMicroelectronics, S.r.l.
- Giuseppina Valvo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Radiation detector of the deltaE-E type with insulation trenches
- Publication number 20080121807
- Publication date May 29, 2008
- STMicroelectronics S.r.l.
- Giuseppina Valvo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Chip-to-chip communication system and method
- Publication number 20070092011
- Publication date Apr 26, 2007
- Luca Ciccarelli
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Measurement alignment system to determine alignment between chips
- Publication number 20070067115
- Publication date Mar 22, 2007
- STMicroelectronics S.r.I.
- Roberto Canegallo
- G01 - MEASURING TESTING