Alberto Gutierrez Jr.

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Fort Collins, CO, US

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Patents Grantslast 30 patents

Information Patent Grant
Programmable capacitance delay element having inverters controlled...
- Patent number 5,283,631
- Issue date Feb 1, 1994
- Hewlett-Packard Co.
- Christopher Koerner
- G01 - MEASURING TESTING
Information Patent Grant
Fine/coarse wired-or tapped delay line
- Patent number 5,243,227
- Issue date Sep 7, 1993
- Hewlett-Packard Company
- Alberto Gutierrez
- G01 - MEASURING TESTING
Information Patent Grant
System for generating an analog regulating voltage
- Patent number 5,233,637
- Issue date Aug 3, 1993
- Hewlett-Packard Company
- Christopher Koerner
- G01 - MEASURING TESTING
Information Patent Grant
CMOS pseudo-NMOS programmable capacitance time vernier and method o...
- Patent number 5,214,680
- Issue date May 25, 1993
- Hewlett-Packard Company
- Alberto Gutierrez
- G01 - MEASURING TESTING