Albertus Aemillius Seyno Sluijterman

Person

Eindhoven, NL

People

Patents Grantslast 30 patents

Information Patent Grant
Method of performing spectroscopy in a transmission charged-particl...
- Patent number 9,778,377
- Issue date Oct 3, 2017
- FEI Company
- Luigi Mele
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Charged-particle microscopy with enhanced electron detection
- Patent number 9,208,993
- Issue date Dec 8, 2015
- FEI Company
- Albertus Aemillius Seyno Sluijterman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle detector system comprising a conversion electrode
- Patent number 8,952,328
- Issue date Feb 10, 2015
- FEI Company
- Albertus Aemillius Seyno Sluijterman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Color display device having quadrupole convergence coils
- Patent number 6,388,401
- Issue date May 14, 2002
- Koninklijke Philips Electronics N.V.
- Antonius Henricus Van Tiel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Combination of a monochrome cathode-ray tube and a deflection unit...
- Patent number 4,703,232
- Issue date Oct 27, 1987
- U.S. Philips Corporation
- Joris A. M. Nieuwendijk
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Device for displaying television pictures including a deflection un...
- Patent number 4,455,542
- Issue date Jun 19, 1984
- U.S. Philips Corporation
- Albertus A. S. Sluijterman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Cathode ray tube having permanent magnets for modulating the deflec...
- Patent number 4,396,897
- Issue date Aug 2, 1983
- U.S. Philips Corporation
- Albertus A. S. Sluijterman
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
CHARGED PARTICLE MICROSCOPE, AND METHOD FOR ADJUSTING A CHARGED PAR...
- Publication number 20200118788
- Publication date Apr 16, 2020
- FEI Company
- Albertus Aemillius Seyno Sluijterman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF PERFORMING SPECTROSCOPY IN A TRANSMISSION CHARGED-PARTICL...
- Publication number 20160276130
- Publication date Sep 22, 2016
- FEI Company
- Luigi Mele
- G01 - MEASURING TESTING
Information Patent Application
Imaging a Sample with Multiple Beams and Multiple Detectors
- Publication number 20150279615
- Publication date Oct 1, 2015
- FEI Company
- Pavel Potocek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED-PARTICLE MICROSCOPY WITH ENHANCED ELECTRON DETECTION
- Publication number 20150155131
- Publication date Jun 4, 2015
- FEI Company
- Albertus Aemillius Seyno Sluijterman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Detector System Comprising a Conversion Electrode
- Publication number 20130056634
- Publication date Mar 7, 2013
- FEI Company
- Albertus Aemillius Seyno Sluijterman
- H01 - BASIC ELECTRIC ELEMENTS

Albertus Aemillius Seyno Sluijterman

Person

Patents Grantslast 30 patents

Method of performing spectroscopy in a transmission charged-particl...

Charged-particle microscopy with enhanced electron detection

Charged particle detector system comprising a conversion electrode

Color display device having quadrupole convergence coils

Combination of a monochrome cathode-ray tube and a deflection unit...

Device for displaying television pictures including a deflection un...

Cathode ray tube having permanent magnets for modulating the deflec...

Patents Applicationslast 30 patents

CHARGED PARTICLE MICROSCOPE, AND METHOD FOR ADJUSTING A CHARGED PAR...

METHOD OF PERFORMING SPECTROSCOPY IN A TRANSMISSION CHARGED-PARTICL...

Imaging a Sample with Multiple Beams and Multiple Detectors

CHARGED-PARTICLE MICROSCOPY WITH ENHANCED ELECTRON DETECTION

Charged Particle Detector System Comprising a Conversion Electrode