Albertus Jan Paulus Maria Van Uden

Person

  • Eindhoven, NL

Patents Grantslast 30 patents

  • Information Patent Grant

    Integrated circuit with test interface

    • Patent number 6,664,798
    • Issue date Dec 16, 2003
    • Koninklijke Philips Electronics N.V.
    • Franciscus Gerardus Maria De Jong
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    Integrated circuit with test interface

    • Publication number 20010015653
    • Publication date Aug 23, 2001
    • U.S. PHILIPS CORPORATION
    • Franciscus Gerardus Maria De Jong
    • G01 - MEASURING TESTING