Albertus Victor Gerardus MANGNUS

Person

Eindhoven, NL

People

Patents Grantslast 30 patents

Information Patent Grant
Multi-source charged particle illumination apparatus
- Patent number 12,125,671
- Issue date Oct 22, 2024
- ASML Netherlands B.V.
- Stijn Wilem Herman Karel Steenbrink
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for image enhancement for a multi-beam charged-...
- Patent number 11,961,700
- Issue date Apr 16, 2024
- ASML Netherlands B.V.
- Maikel Robert Goosen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods for real time stereo imaging using multiple ele...
- Patent number 11,942,303
- Issue date Mar 26, 2024
- ASML Netherlands B.V.
- Yan Ren
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Pulsed charged-particle beam system
- Patent number 11,942,302
- Issue date Mar 26, 2024
- ASML Netherlands B.V.
- Arno Jan Bleeker
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus for and method of controlling an energy spread of a charg...
- Patent number 11,881,374
- Issue date Jan 23, 2024
- ASML Netherlands B.V.
- Shakeeb Bin Hasan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle optical device, objective lens assembly, detector,...
- Patent number 11,821,859
- Issue date Nov 21, 2023
- ASML Netherlands B.V.
- Marco Jan-Jaco Wieland
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Aperture array with integrated current measurement
- Patent number 11,791,132
- Issue date Oct 17, 2023
- ASML Netherlands B.V.
- Albertus Victor Gerardus Mangnus
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inspection tool, inspection method and computer program product
- Patent number 11,442,368
- Issue date Sep 13, 2022
- ASML Netherlands B.V.
- Richard Quintanilha
- G01 - MEASURING TESTING
Information Patent Grant
Inspection tool, lithographic apparatus, electron beam source and a...
- Patent number 11,243,179
- Issue date Feb 8, 2022
- ASML Netherlands B.V.
- Erwin Paul Smakman
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
CHARGED PARTICLE DEVICE, CHARGED PARTICLE ASSESSMENT APPARATUS, MEA...
- Publication number 20240339292
- Publication date Oct 10, 2024
- ASML NETHERLANDS B.V.
- Yan REN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED-PARTICLE APPARATUS, MULTI-DEVICE APPARATUS, METHOD OF USING...
- Publication number 20240331968
- Publication date Oct 3, 2024
- ASML NETHERLANDS B.V.
- Yan REN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE DETECTOR
- Publication number 20240280517
- Publication date Aug 22, 2024
- ASML NETHERLANDS B.V.
- Albertus Victor Gerardus MANGNUS
- G01 - MEASURING TESTING
Information Patent Application
CHARGED PARTICLE DETECTOR ASSEMBLY
- Publication number 20240272312
- Publication date Aug 15, 2024
- ASML NETHERLANDS B.V.
- Albertus Victor Gerardus MANGNUS
- G01 - MEASURING TESTING
Information Patent Application
CHARGED PARTICLE APPARATUS AND METHOD
- Publication number 20240128043
- Publication date Apr 18, 2024
- ASML NETHERLANDS B.V.
- Jurgen VAN SOEST
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE DEVICE AND METHOD
- Publication number 20240087835
- Publication date Mar 14, 2024
- ASML NETHERLANDS B.V.
- Albertus Victor Gerardus MANGNUS
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE OPTICAL DEVICE, OBJECTIVE LENS ASSEMBLY, DETECTOR,...
- Publication number 20240087844
- Publication date Mar 14, 2024
- ASML NETHERLANDS B.V.
- Albertus Victor Gerardus MANGNUS
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE OPTICAL DEVICE, OBJECTIVE LENS ASSEMBLY, DETECTOR,...
- Publication number 20240044824
- Publication date Feb 8, 2024
- ASML NETHERLANDS B.V.
- Marco Jan-Jaco WIELAND
- G01 - MEASURING TESTING
Information Patent Application
CHARGED PARTICLE TOOL, CALIBRATION METHOD, INSPECTION METHOD
- Publication number 20230324318
- Publication date Oct 12, 2023
- ASML NETHERLANDS B.V.
- Yan REN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTI-BEAM CHARGED PARTICLE COLUMN
- Publication number 20230207255
- Publication date Jun 29, 2023
- ASML NETHERLANDS B.V.
- Vincent Claude BEUGIN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PULSED CHARGED-PARTICLE BEAM SYSTEM
- Publication number 20230154722
- Publication date May 18, 2023
- ASML NETHERLANDS B.V.
- Arno Jan BLEEKER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR REAL TIME STEREO IMAGING USING MULTIPLE ELE...
- Publication number 20230154723
- Publication date May 18, 2023
- ASML NETHERLANDS B.V.
- Yan REN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS FOR AND METHOD OF CONTROL OF A CHARGED PARTICLE BEAM
- Publication number 20230048580
- Publication date Feb 16, 2023
- ASML NETHERLANDS B.V.
- Albertus Victor Gerardus MANGNUS
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE DEVICE, DETECTOR, AND METHODS
- Publication number 20230005706
- Publication date Jan 5, 2023
- ASML NETHERLANDS B.V.
- Albertus Victor Gerardus MANGNUS
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTI-SOURCE CHARGED PARTICLE ILLUMINATION APPARATUS
- Publication number 20220415611
- Publication date Dec 29, 2022
- ASML NETHERLANDS B.V.
- Stijn Wilem Herman Karel STEENBRINK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR FORMING A PATTERNED LAYER OF MATERIAL
- Publication number 20220213593
- Publication date Jul 7, 2022
- ASML NETHERLANDS B.V.
- Tamara DRUZHININA
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
SYSTEMS AND METHODS FOR IMAGE ENHANCEMENT FOR A MULTI-BEAM CHARGED-...
- Publication number 20220199358
- Publication date Jun 23, 2022
- ASML NETHERLANDS B.V.
- Maikel Robert GOOSEN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS FOR AND METHOD OF LOCAL CONTROL OF A CHARGED PARTICLE BEAM
- Publication number 20220199355
- Publication date Jun 23, 2022
- ASML NETHERLANDS B.V.
- Albertus Victor Gerardus MANGNUS
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE OPTICAL DEVICE, OBJECTIVE LENS ASSEMBLY, DETECTOR,...
- Publication number 20220196581
- Publication date Jun 23, 2022
- ASML NETHERLANDS B.V.
- Marco Jan-Jaco WIELAND
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS FOR AND METHOD OF CONTROLLING AN ENERGY SPREAD OF A CHARG...
- Publication number 20220148842
- Publication date May 12, 2022
- ASML NETHERLANDS B.V.
- Shakeeb Bin HASAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON BEAM APPARATUS, INSPECTION TOOL AND INSPECTION METHOD
- Publication number 20210249224
- Publication date Aug 12, 2021
- ASML NETHERLANDS B.V.
- Erwin Paul SMAKMAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INSPECTION TOOL, INSPECTION METHOD AND COMPUTER PROGRAM PRODUCT
- Publication number 20210232052
- Publication date Jul 29, 2021
- ASML NETHERLANDS B.V.
- Richard QUINTANILHA
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION SYSTEM, LITHOGRAPHIC APPARATUS, AND INSPECTION METHOD
- Publication number 20210055660
- Publication date Feb 25, 2021
- ASML NETHERLANDS B.V.
- Alexey Olegovich POLYAKOV
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APERTURE ARRAY WITH INTEGRATED CURRENT MEASUREMENT
- Publication number 20200312619
- Publication date Oct 1, 2020
- ASML NETHERLANDS B.V.
- Albertus Victor Gerardus MANGNUS
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INSPECTION TOOL, LITHOGRAPHIC APPARATUS, ELECTRON BEAM SOURCE AND A...
- Publication number 20200249181
- Publication date Aug 6, 2020
- ASML NETHERLANDS B.V.
- Erwin Paul SMAKMAN
- G01 - MEASURING TESTING

Albertus Victor Gerardus MANGNUS

Person

Patents Grantslast 30 patents

Multi-source charged particle illumination apparatus

Systems and methods for image enhancement for a multi-beam charged-...

Systems and methods for real time stereo imaging using multiple ele...

Pulsed charged-particle beam system

Apparatus for and method of controlling an energy spread of a charg...

Charged particle optical device, objective lens assembly, detector,...

Aperture array with integrated current measurement

Inspection tool, inspection method and computer program product

Inspection tool, lithographic apparatus, electron beam source and a...

Patents Applicationslast 30 patents

CHARGED PARTICLE DEVICE, CHARGED PARTICLE ASSESSMENT APPARATUS, MEA...

CHARGED-PARTICLE APPARATUS, MULTI-DEVICE APPARATUS, METHOD OF USING...

CHARGED PARTICLE DETECTOR

CHARGED PARTICLE DETECTOR ASSEMBLY

CHARGED PARTICLE APPARATUS AND METHOD

CHARGED PARTICLE DEVICE AND METHOD

CHARGED PARTICLE OPTICAL DEVICE, OBJECTIVE LENS ASSEMBLY, DETECTOR,...

CHARGED PARTICLE OPTICAL DEVICE, OBJECTIVE LENS ASSEMBLY, DETECTOR,...

CHARGED PARTICLE TOOL, CALIBRATION METHOD, INSPECTION METHOD

MULTI-BEAM CHARGED PARTICLE COLUMN

PULSED CHARGED-PARTICLE BEAM SYSTEM

SYSTEMS AND METHODS FOR REAL TIME STEREO IMAGING USING MULTIPLE ELE...

APPARATUS FOR AND METHOD OF CONTROL OF A CHARGED PARTICLE BEAM

CHARGED PARTICLE DEVICE, DETECTOR, AND METHODS

MULTI-SOURCE CHARGED PARTICLE ILLUMINATION APPARATUS

METHOD AND APPARATUS FOR FORMING A PATTERNED LAYER OF MATERIAL

SYSTEMS AND METHODS FOR IMAGE ENHANCEMENT FOR A MULTI-BEAM CHARGED-...

APPARATUS FOR AND METHOD OF LOCAL CONTROL OF A CHARGED PARTICLE BEAM

CHARGED PARTICLE OPTICAL DEVICE, OBJECTIVE LENS ASSEMBLY, DETECTOR,...

APPARATUS FOR AND METHOD OF CONTROLLING AN ENERGY SPREAD OF A CHARG...

ELECTRON BEAM APPARATUS, INSPECTION TOOL AND INSPECTION METHOD

INSPECTION TOOL, INSPECTION METHOD AND COMPUTER PROGRAM PRODUCT

INSPECTION SYSTEM, LITHOGRAPHIC APPARATUS, AND INSPECTION METHOD

APERTURE ARRAY WITH INTEGRATED CURRENT MEASUREMENT

INSPECTION TOOL, LITHOGRAPHIC APPARATUS, ELECTRON BEAM SOURCE AND A...