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Albrecht Weiss
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Linden, DE
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Patents Grants
last 30 patents
Information
Patent Grant
Method for imaging in a microscope with oblique illumination
Patent number
10,823,951
Issue date
Nov 3, 2020
Leica Microsystems CMS GmbH
Benjamin Deissler
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Microscope illumination method and microscope
Patent number
9,354,436
Issue date
May 31, 2016
Leica Microsystems CMS GmbH
Albrecht Weiss
G02 - OPTICS
Information
Patent Grant
Microscope illumination method and microscope
Patent number
9,297,992
Issue date
Mar 29, 2016
Leica Microsystems CMS GmbH
Michael Ganser
G02 - OPTICS
Information
Patent Grant
Microscope illumination system, microscope and oblique incident ill...
Patent number
9,250,432
Issue date
Feb 2, 2016
Leica Microsystems CMS GmbH
Albrecht Weiss
G02 - OPTICS
Information
Patent Grant
Illuminating arrangement for a microscope
Patent number
9,042,012
Issue date
May 26, 2015
Leica Microsystems CMS GmbH
Albrecht Weiss
G02 - OPTICS
Information
Patent Grant
Fluorescence microscope having an illumination device
Patent number
8,922,885
Issue date
Dec 30, 2014
Leica Microsystems CMS GmbH
Michael Ganser
G02 - OPTICS
Information
Patent Grant
Microscope comprising a camera connection and a camera adapter
Patent number
8,643,711
Issue date
Feb 4, 2014
Leica Microsystems CMS GmbH
Michael Ganser
G02 - OPTICS
Information
Patent Grant
Apparatus for positioning optical components in an optical device
Patent number
8,395,840
Issue date
Mar 12, 2013
Leica Microsystems CMS GmbH
Michael Ganser
G02 - OPTICS
Information
Patent Grant
Laser microdissection unit
Patent number
7,485,878
Issue date
Feb 3, 2009
Leica Microsystems CMS GmbH
Albrecht Weiss
G01 - MEASURING TESTING
Information
Patent Grant
Objective and microscope
Patent number
7,486,441
Issue date
Feb 3, 2009
Leica Microsystems CMS GmbH
Albrecht Weiss
G02 - OPTICS
Information
Patent Grant
Microscope, and method for modifying the light flux in a microscope
Patent number
7,391,567
Issue date
Jun 24, 2008
Leica Microsystems CMS GmbH
Albrecht Weiss
G02 - OPTICS
Information
Patent Grant
Reflected-light microscope
Patent number
7,379,238
Issue date
May 27, 2008
Leica Microsystems CMS GmbH
Michael Ganser
G02 - OPTICS
Information
Patent Grant
Microscope and microscopy method for producing overlay images
Patent number
7,079,316
Issue date
Jul 18, 2006
Leica Microsystems CMS GmbH
Albrecht Weiss
G02 - OPTICS
Information
Patent Grant
Laser microdissection device
Patent number
7,035,004
Issue date
Apr 25, 2006
Leica Microsystems Wetzlar GmbH
Albrecht Weiss
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Method and apparatus for color-neutral brightness regulating of a l...
Patent number
7,027,238
Issue date
Apr 11, 2006
Leica Microsystems Wetzlar GmbH
Albrecht Weiss
G02 - OPTICS
Information
Patent Grant
Iris diaphragm device
Patent number
6,980,376
Issue date
Dec 27, 2005
Leica Microsystems Wetzlar GmbH
Stefan Bamberger
G02 - OPTICS
Information
Patent Grant
Device for laser cutting preparations, and a microscope
Patent number
6,907,798
Issue date
Jun 21, 2005
Leica Microsystems Wetzlar GmbH
Michael Ganser
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for laser microdissection
Patent number
6,787,301
Issue date
Sep 7, 2004
Leica Microsystems Wetzlar GmbH
Michael Ganser
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Method for the individual adaptation of excitation intensities in a...
Patent number
6,747,280
Issue date
Jun 8, 2004
Leica Microsystems Wetzlar GmbH
Albrecht Weiss
G02 - OPTICS
Information
Patent Grant
Method and apparatus for measuring thickness of transparent films
Patent number
6,545,765
Issue date
Apr 8, 2003
Leica Microsystems Heidelberg GmbH
Michael Ganser
G01 - MEASURING TESTING
Information
Patent Grant
Holder for attaching a component with a dovetail slot
Patent number
6,384,992
Issue date
May 7, 2002
Leica Microsystems Wetzlar GmbH
Albrecht Weiss
B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information
Patent Grant
Illumination device for a microscope including two light sources
Patent number
6,369,939
Issue date
Apr 9, 2002
Leica Microsystems Wetzlar GmbH
Albrecht Weiss
G02 - OPTICS
Patents Applications
last 30 patents
Information
Patent Application
METHOD FOR IMAGING IN A MICROSCOPE WITH OBLIQUE ILLUMINATION
Publication number
20190391380
Publication date
Dec 26, 2019
Leica Microsystems CMS GmbH
Benjamin Deissler
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
ILLUMINATING ARRANGEMENT FOR A MICROSCOPE
Publication number
20130094078
Publication date
Apr 18, 2013
Leica Microsystems CMS GmbH
Albrecht Weiss
G02 - OPTICS
Information
Patent Application
Microscope Illumination Method and Microscope
Publication number
20130027769
Publication date
Jan 31, 2013
Leica Microsystems CMS GmbH
Albrecht Weiss
G02 - OPTICS
Information
Patent Application
Microscope Illumination Method and Microscope
Publication number
20130027770
Publication date
Jan 31, 2013
Leica Microsystems CMS GmbH
Michael Ganser
G02 - OPTICS
Information
Patent Application
MICROSCOPE ILLUMINATION SYSTEM, MICROSCOPE AND OBLIQUE INCIDENT ILL...
Publication number
20120086795
Publication date
Apr 12, 2012
Leica Microsystems CMS GmbH
Albrecht Weiss
G02 - OPTICS
Information
Patent Application
APPARATUS FOR POSITIONING OPTICAL COMPONENTS IN AN OPTICAL DEVICE
Publication number
20110026112
Publication date
Feb 3, 2011
Michael Ganser
G02 - OPTICS
Information
Patent Application
MICROSCOPE COMPRISING A CAMERA CONNECTION AND A CAMERA ADAPTER
Publication number
20090195646
Publication date
Aug 6, 2009
Michael Ganser
G02 - OPTICS
Information
Patent Application
FLUORESCENCE MICROSCOPE HAVING AN ILLUMINATION DEVICE
Publication number
20080198448
Publication date
Aug 21, 2008
Leica Microsystems CMS GmbH
Michael Ganser
G02 - OPTICS
Information
Patent Application
Led-Module Used for Illumination in a Microscope
Publication number
20080151368
Publication date
Jun 26, 2008
Leica Microsystems CMS GmbH
Albrecht Weiss
G02 - OPTICS
Information
Patent Application
Objective and microscope
Publication number
20060209398
Publication date
Sep 21, 2006
Leica Microsystems CMS GmbH
Albrecht Weiss
G02 - OPTICS
Information
Patent Application
Laser microdissection unit
Publication number
20060186349
Publication date
Aug 24, 2006
Leica Microsystems CMS GmbH
Albrecht Weiss
G02 - OPTICS
Information
Patent Application
Microscope having at least one beam splitter and a scattered light...
Publication number
20040252379
Publication date
Dec 16, 2004
Leica Microsystems Wetzlar GmbH
Albrecht Weiss
G02 - OPTICS
Information
Patent Application
Microscope and microscopy method for producing overlay images
Publication number
20040223215
Publication date
Nov 11, 2004
Leica Microsystems Wetzlar GmbH
Albrecht Weiss
G02 - OPTICS
Information
Patent Application
Iris diaphragm device
Publication number
20040174616
Publication date
Sep 9, 2004
Leica Microsystems Wetzlar GmbH
Stefan Bamberger
G02 - OPTICS
Information
Patent Application
Microscope, and method for modifying the light flux in a microscope
Publication number
20040095640
Publication date
May 20, 2004
Leica Microsystems Wetzlar GmbH
Albrecht Weiss
G02 - OPTICS
Information
Patent Application
Laser microdissection device
Publication number
20030133190
Publication date
Jul 17, 2003
Albrecht Weiss
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Application
Device for laser cutting preparations, and a microscope
Publication number
20030075530
Publication date
Apr 24, 2003
Michael Ganser
G02 - OPTICS
Information
Patent Application
Method and apparatus for color-neutral brightness regulating of a l...
Publication number
20030011910
Publication date
Jan 16, 2003
Leica Microsystems Wetzlar GmbH.
Albrecht Weiss
G02 - OPTICS
Information
Patent Application
Method and device for laser cutting microscopic samples
Publication number
20020164678
Publication date
Nov 7, 2002
Michael Ganser
G01 - MEASURING TESTING
Information
Patent Application
Apparatus for receiving microdissected specimens
Publication number
20020061261
Publication date
May 23, 2002
Gerhard Pfeifer
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus for laser microdissection
Publication number
20020056345
Publication date
May 16, 2002
Michael Ganser
G01 - MEASURING TESTING