Alec Madsen

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San Francisco, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Microelectronic contact structure
- Patent number 7,731,546
- Issue date Jun 8, 2010
- FormFactor, Inc.
- Gary W. Grube
- G01 - MEASURING TESTING
Information Patent Grant
Microelectronic contact structure
- Patent number 6,945,827
- Issue date Sep 20, 2005
- FormFactor, Inc.
- Gary W. Grube
- G01 - MEASURING TESTING
Information Patent Grant
Interconnection element with contact blade
- Patent number 6,825,422
- Issue date Nov 30, 2004
- FormFactor, Inc.
- Benjamin N. Eldridge
- G01 - MEASURING TESTING
Information Patent Grant
Contact structures with blades having a wiping motion
- Patent number 6,441,315
- Issue date Aug 27, 2002
- FormFactor, Inc.
- Benjamin N. Eldridge
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Microelectronic contact structure
- Publication number 20070270041
- Publication date Nov 22, 2007
- FormFactor, Inc.
- Gary W. Grube
- G01 - MEASURING TESTING
Information Patent Application
Tested semiconductor device produced by an interconnection element...
- Publication number 20040177499
- Publication date Sep 16, 2004
- Benjamin N. Eldridge
- G01 - MEASURING TESTING
Information Patent Application
Microelectronic contact structure
- Publication number 20040121627
- Publication date Jun 24, 2004
- FormFactor, Inc.
- Gary W. Grube
- G01 - MEASURING TESTING
Information Patent Application
Interconnection element with contact blade
- Publication number 20030015347
- Publication date Jan 23, 2003
- FormFactor, Inc.
- Benjamin N. Eldridge
- G01 - MEASURING TESTING