Alejandro Alberto Cook Lobo

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Stuttgart, DE

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Patents Grantslast 30 patents

Information Patent Grant
Dynamic guard band with timing protection and with performance prot...
- Patent number 11,989,071
- Issue date May 21, 2024
- International Business Machines Corporation
- Tobias Webel
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Dynamic guard band with timing protection and with performance prot...
- Patent number 11,953,982
- Issue date Apr 9, 2024
- International Business Machines Corporation
- Alejandro Alberto Cook Lobo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Testing a single chip in a wafer probing system
- Patent number 11,808,808
- Issue date Nov 7, 2023
- International Business Machines Corporation
- Thomas Gentner
- G01 - MEASURING TESTING
Information Patent Grant
Logic built-in self-test of an electronic circuit
- Patent number 11,574,695
- Issue date Feb 7, 2023
- International Business Machines Corporation
- Alejandro Alberto Cook Lobo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Constrained pseudorandom test pattern for in-system logic built-in...
- Patent number 10,746,790
- Issue date Aug 18, 2020
- International Business Machines Corporation
- Alejandro Alberto Cook Lobo
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DYNAMIC GUARD BAND WITH TIMING PROTECTION AND WITH PERFORMANCE PROT...
- Publication number 20240028447
- Publication date Jan 25, 2024
- International Business Machines Corporation
- Alejandro Alberto Cook Lobo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DYNAMIC GUARD BAND WITH TIMING PROTECTION AND WITH PERFORMANCE PROT...
- Publication number 20240028095
- Publication date Jan 25, 2024
- International Business Machines Corporation
- Tobias Webel
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TESTING A SINGLE CHIP IN A WAFER PROBING SYSTEM
- Publication number 20240019488
- Publication date Jan 18, 2024
- International Business Machines Corporation
- Thomas Gentner
- G01 - MEASURING TESTING
Information Patent Application
TESTING A SINGLE CHIP IN A WAFER PROBING SYSTEM
- Publication number 20230176116
- Publication date Jun 8, 2023
- International Business Machines Corporation
- Thomas Gentner
- G01 - MEASURING TESTING
Information Patent Application
LOGIC BUILT-IN SELF-TEST OF AN ELECTRONIC CIRCUIT
- Publication number 20230035157
- Publication date Feb 2, 2023
- International Business Machines Corporation
- Alejandro Alberto Cook Lobo
- G06 - COMPUTING CALCULATING COUNTING