Aleksander Labuda

Person

Goleta, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Automated optimization of AFM light source positioning
- Patent number 12,055,560
- Issue date Aug 6, 2024
- Oxford Instruments Asylum Research, Inc.
- Jason Bemis
- G01 - MEASURING TESTING
Information Patent Grant
Metrological scanning probe microscope
- Patent number RE49997
- Issue date Jun 4, 2024
- Oxford Instruments Asylum Research, Inc.
- Aleksander Labuda
Information Patent Grant
Automated optimization of AFM light source positioning
- Patent number 11,644,478
- Issue date May 9, 2023
- Oxford Instruments Asylum Research, Inc.
- Jason Bemis
- G01 - MEASURING TESTING
Information Patent Grant
Metrological scanning probe microscope
- Patent number 10,705,114
- Issue date Jul 7, 2020
- Oxford Instruments Asylum Research Inc
- Aleksander Labuda
- G01 - MEASURING TESTING
Information Patent Grant
AM/FM measurements using multiple frequency atomic force microscopy
- Patent number 10,444,258
- Issue date Oct 15, 2019
- Oxford Instruments Asylum Research Inc
- Roger Proksch
- G01 - MEASURING TESTING
Information Patent Grant
Metrological scanning probe microscope
- Patent number 10,338,096
- Issue date Jul 2, 2019
- Oxford Instruments Asylum Research Inc
- Aleksander Labuda
- G01 - MEASURING TESTING
Information Patent Grant
Optical beam positioning unit for atomic force microscope
- Patent number 10,054,612
- Issue date Aug 21, 2018
- Oxford Instruments Asylum Research Inc
- Aleksander Labuda
- G01 - MEASURING TESTING
Information Patent Grant
AM/FM measurements using multiple frequency of atomic force microscopy
- Patent number 9,841,436
- Issue date Dec 12, 2017
- Oxford Instruments Asylum Research Inc
- Roger Proksch
- G01 - MEASURING TESTING
Information Patent Grant
Metrological scanning probe microscope
- Patent number 9,804,193
- Issue date Oct 31, 2017
- Oxford Instruments Asylum Research, Inc.
- Aleksander Labuda
- G01 - MEASURING TESTING
Information Patent Grant
AM/FM measurements using multiple frequency of atomic force microscopy
- Patent number 9,453,857
- Issue date Sep 27, 2016
- Oxford Instruments Asylum Research, Inc.
- Roger Proksch
- G01 - MEASURING TESTING
Information Patent Grant
Optical beam positioning unit for atomic force microscope
- Patent number 9,383,386
- Issue date Jul 5, 2016
- Oxford Instruments Asylum Research, Inc.
- Aleksander Labuda
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
AUTOMATED OPTIMIZATION OF AFM LIGHT SOURCE POSITIONING
- Publication number 20230251284
- Publication date Aug 10, 2023
- Oxford Instruments Asylum Research, Inc.
- Jason Bemis
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED OPTIMIZATION OF AFM LIGHT SOURCE POSITIONING
- Publication number 20220244289
- Publication date Aug 4, 2022
- Oxford Instruments Asylum Research, Inc.
- Jason Bemis
- G01 - MEASURING TESTING
Information Patent Application
Metrological Scanning Probe Microscope
- Publication number 20190324054
- Publication date Oct 24, 2019
- Oxford Instruments Asylum Research, Inc.
- Aleksander Labuda
- G01 - MEASURING TESTING
Information Patent Application
AM/FM MEASUREMENTS USING MULTIPLE FREQUENCY ATOMIC FORCE MICROSCOPY
- Publication number 20180292432
- Publication date Oct 11, 2018
- Oxford Instruments Asylum Research, Inc.
- Roger Proksch
- G01 - MEASURING TESTING
Information Patent Application
Metrological Scanning Probe Microscope
- Publication number 20180128853
- Publication date May 10, 2018
- Oxford Instruments Asylum Research, Inc.
- Aleksander Labuda
- G01 - MEASURING TESTING
Information Patent Application
AM/FM Measurements Using Multiple Frequency of Atomic Force Microscopy
- Publication number 20170131322
- Publication date May 11, 2017
- Oxford Instruments Asylum Research, Inc.
- Roger Proksch
- G01 - MEASURING TESTING
Information Patent Application
Optical Beam Positioning Unit for Atomic Force Microscope
- Publication number 20160313368
- Publication date Oct 27, 2016
- Oxford Instruments Asylum Research, Inc.
- Aleksander Labuda
- G01 - MEASURING TESTING
Information Patent Application
Metrological Scanning Probe Microscope
- Publication number 20160169937
- Publication date Jun 16, 2016
- Oxford Instruments Asylum Research, Inc.
- Aleksander Labuda
- G01 - MEASURING TESTING
Information Patent Application
AM/FM Measurements Using Multiple Frequency of Atomic Force Microscopy
- Publication number 20150309071
- Publication date Oct 29, 2015
- Oxford Instruments Asylum Research, Inc.
- Roger Proksch
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL BEAM POSITIONING UNIT FOR ATOMIC FORCE MICROSCOPE
- Publication number 20140317790
- Publication date Oct 23, 2014
- Aleksander Labuda
- G01 - MEASURING TESTING

Aleksander Labuda

Person

Patents Grantslast 30 patents

Automated optimization of AFM light source positioning

Metrological scanning probe microscope

Automated optimization of AFM light source positioning

Metrological scanning probe microscope

AM/FM measurements using multiple frequency atomic force microscopy

Metrological scanning probe microscope

Optical beam positioning unit for atomic force microscope

AM/FM measurements using multiple frequency of atomic force microscopy

Metrological scanning probe microscope

AM/FM measurements using multiple frequency of atomic force microscopy

Optical beam positioning unit for atomic force microscope

Patents Applicationslast 30 patents

AUTOMATED OPTIMIZATION OF AFM LIGHT SOURCE POSITIONING

AUTOMATED OPTIMIZATION OF AFM LIGHT SOURCE POSITIONING

Metrological Scanning Probe Microscope

AM/FM MEASUREMENTS USING MULTIPLE FREQUENCY ATOMIC FORCE MICROSCOPY

Metrological Scanning Probe Microscope

AM/FM Measurements Using Multiple Frequency of Atomic Force Microscopy

Optical Beam Positioning Unit for Atomic Force Microscope

Metrological Scanning Probe Microscope

AM/FM Measurements Using Multiple Frequency of Atomic Force Microscopy

OPTICAL BEAM POSITIONING UNIT FOR ATOMIC FORCE MICROSCOPE