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Aleksandr Komelkov
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Almelo, NL
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last 30 patents
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Patent Grant
Quantitative X-ray analysis—multi optical path instrument
Patent number
9,739,730
Issue date
Aug 22, 2017
PANalytical B.V.
Petronella Emerentiana Hegeman
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
Quantitative X-ray Analysis - Multi optical path instrument
Publication number
20160258892
Publication date
Sep 8, 2016
PANALYTICAL B.V.
Petronella Emerentiana Hegeman
G01 - MEASURING TESTING