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Aleksey Petrenko
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Milpitas, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Illumination energy management in surface inspection
Patent number
9,194,812
Issue date
Nov 24, 2015
KLA-Tencor Corporation
Christian Wolters
F21 - LIGHTING
Information
Patent Grant
Method and apparatus for producing and measuring dynamically focuss...
Patent number
9,068,952
Issue date
Jun 30, 2015
KLA-Tencor Corporation
Aleksey Petrenko
G01 - MEASURING TESTING
Information
Patent Grant
Monitoring incident beam position in a wafer inspection system
Patent number
8,934,091
Issue date
Jan 13, 2015
KLA-Tencor Corp.
Juergen Reich
G01 - MEASURING TESTING
Information
Patent Grant
Illumination energy management in surface inspection
Patent number
8,786,850
Issue date
Jul 22, 2014
KLA-Tencor Corporation
Christian Wolters
F21 - LIGHTING
Information
Patent Grant
Method for improving edge handling chuck aerodynamics
Patent number
8,042,254
Issue date
Oct 25, 2011
KLA-Tencor Corporation
Alexander Belyaev
Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information
Patent Grant
System and method to create haze standard
Patent number
7,605,915
Issue date
Oct 20, 2009
KLA-Tencor Corporation
Christian Wolters
G01 - MEASURING TESTING
Information
Patent Grant
Computer-implemented methods and systems for determining a configur...
Patent number
7,436,505
Issue date
Oct 14, 2008
KLA-Tencor Technologies Corp.
Alexander Belyaev
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Illumination Energy Management in Surface Inspection
Publication number
20140328043
Publication date
Nov 6, 2014
Christian Wolters
G01 - MEASURING TESTING
Information
Patent Application
Illumination Energy Management in Surface Inspection
Publication number
20140118729
Publication date
May 1, 2014
KLA-Tencor Corporation
Christian Wolters
G01 - MEASURING TESTING
Information
Patent Application
Monitoring Incident Beam Position in a Wafer Inspection System
Publication number
20140071437
Publication date
Mar 13, 2014
KLA-Tencor Corporation
Juergen Reich
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus for producing and Measuring dynamically focuss...
Publication number
20110051132
Publication date
Mar 3, 2011
Aleksey Petrenko
G02 - OPTICS
Information
Patent Application
SYSTEM AND METHOD TO CREATE HAZE STANDARD
Publication number
20080245958
Publication date
Oct 9, 2008
Christian Wolters
G01 - MEASURING TESTING
Information
Patent Application
Computer-Implemented Methods and Systems for Determining a Configur...
Publication number
20070229809
Publication date
Oct 4, 2007
KLA-TENCOR TECHNOLOGIES CORP.
Alexander Belyaev
G01 - MEASURING TESTING