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Alex Bratkovski
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Palo Alto, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Integrated heat sink for a microchip
Patent number
7,763,973
Issue date
Jul 27, 2010
Hewlett-Packard Development Company, L.P.
Alex Bratkovski
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Nanowire-based modulators
Patent number
7,711,213
Issue date
May 4, 2010
Hewlett-Packard Development Company, L.P.
Shih-Yuan Wang
G02 - OPTICS
Information
Patent Grant
Photonic crystal laser sensors and methods
Patent number
7,492,979
Issue date
Feb 17, 2009
Hewlett-Packard Development Company, L.P.
Shih-Yuan Wang
G01 - MEASURING TESTING
Information
Patent Grant
System and method for cantilever based calorimetric analysis
Patent number
7,429,125
Issue date
Sep 30, 2008
Hewlett-Packard Development Company, L.P.
Manish Sharma
G01 - MEASURING TESTING
Information
Patent Grant
Mach Zehnder photonic crystal sensors and methods
Patent number
7,289,221
Issue date
Oct 30, 2007
Hewlett-Packard Development Company, L.P.
Shih-Yuan Wang
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
ELECTRICALLY DRIVEN DEVICES FOR SURFACE ENHANCED RAMAN SPECTROSCOPY
Publication number
20120113420
Publication date
May 10, 2012
Huei Pei Kuo
G01 - MEASURING TESTING
Information
Patent Application
Nanowire-based modulators
Publication number
20080181551
Publication date
Jul 31, 2008
Shih-Yuan Wang
G02 - OPTICS
Information
Patent Application
System and method for cantilever based calorimetric analysis
Publication number
20070104245
Publication date
May 10, 2007
Manish Sharma
G01 - MEASURING TESTING
Information
Patent Application
System and method for identifying proteins
Publication number
20060084186
Publication date
Apr 20, 2006
Alison Chaiken
G01 - MEASURING TESTING
Information
Patent Application
Photonic crystal laser sensors and methods
Publication number
20060072642
Publication date
Apr 6, 2006
Shih-Yuan Wang
G02 - OPTICS
Information
Patent Application
Mach Zehnder photonic crystal sensors and methods
Publication number
20060066866
Publication date
Mar 30, 2006
Shih-Yuan Wang
G01 - MEASURING TESTING