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Alex Fayer
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Herzelia, IL
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last 30 patents
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Patent Grant
Method and apparatus for dispersion measurement
Patent number
6,614,515
Issue date
Sep 2, 2003
LaserComm, Inc.
Alex Fayer
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
NOVEL MATERIAL AND PROCESS FOR INTEGRATED ION CHIP
Publication number
20090321719
Publication date
Dec 31, 2009
BEN GURION UNIVERSITY OF THE NEGEV RESEARCH AND DEVELOPMENT AUTHORITY
Ron FOLMAN
G06 - COMPUTING CALCULATING COUNTING
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Patent Application
METHOD AND APPARATUS FOR DISPERSION MEASUREMENT
Publication number
20030128354
Publication date
Jul 10, 2003
Alex Fayer
G01 - MEASURING TESTING