TREA

Alex Shtarker

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  • San Jose, CA, US
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Patents Grantslast 30 patents

  • Information Patent Grant

    Probe retention arrangement
    • Patent number 9,310,428
    • Issue date Apr 12, 2016
    • FormFactor, Inc.
    • January Kister
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Probe retention arrangement
    • Patent number 8,907,689
    • Issue date Dec 9, 2014
    • MicroProbe, Inc.
    • January Kister
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    PROBE RETENTION ARRANGEMENT
    • Publication number 20150091596
    • Publication date Apr 2, 2015
    • FormFactor, Inc.
    • January Kister
    • G01 - MEASURING TESTING
  • Information Patent Application

    PROBE RETENTION ARRANGEMENT
    • Publication number 20110006796
    • Publication date Jan 13, 2011
    • MicroProbe, Inc.
    • January Kister
    • G01 - MEASURING TESTING