Alex S.Y. Koh

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Austin, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
Method for producing test patterns for testing an integrated circuit
- Patent number 7,047,174
- Issue date May 16, 2006
- FREESCALE SEMICONDUCTOR, INC.
- Alex S. Y. Koh
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method for producing test patterns for testing an integrated circuit
- Publication number 20020163351
- Publication date Nov 7, 2002
- Alex S.Y. Koh
- G01 - MEASURING TESTING