Alex Tokar

Person

Haifa, IL

People

Patents Grantslast 30 patents

Information Patent Grant
Measurement of small features using XRF
- Patent number 9,829,448
- Issue date Nov 28, 2017
- BRUKER JV ISRAEL LTD.
- Matthew Wormington
- G01 - MEASURING TESTING
Information Patent Grant
Method for accurately determining the thickness and/or elemental co...
- Patent number 9,632,043
- Issue date Apr 25, 2017
- BRUKER JV ISRAEL LTD.
- Isaac Mazor
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
X-ray inspection of bumps on a semiconductor substrate
- Patent number 9,390,984
- Issue date Jul 12, 2016
- BRUKER JV ISRAEL LTD.
- Isaac Mazor
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Estimation of XRF intensity from an array of micro-bumps
- Patent number 9,389,192
- Issue date Jul 12, 2016
- BRUKER JV ISRAEL LTD.
- Alex Tokar
- G01 - MEASURING TESTING
Information Patent Grant
X-ray measurement of properties of nano-particles
- Patent number 7,680,243
- Issue date Mar 16, 2010
- Jordan Valley Semiconductors Ltd.
- Boris Yokhin
- G01 - MEASURING TESTING
Information Patent Grant
Inspection of small features using X-ray fluorescence
- Patent number 7,653,174
- Issue date Jan 26, 2010
- Jordan Valley Semiconductors Ltd.
- Isaac Mazor
- G01 - MEASURING TESTING
Information Patent Grant
Automated selection of X-ray reflectometry measurement locations
- Patent number 7,649,978
- Issue date Jan 19, 2010
- Jordan Valley Semiconductors Ltd.
- Isaac Mazor
- G01 - MEASURING TESTING
Information Patent Grant
Multi-detector EDXRD
- Patent number 7,321,652
- Issue date Jan 22, 2008
- Jordan Valley Semiconductors Ltd.
- Boris Yokhin
- G01 - MEASURING TESTING
Information Patent Grant
Detection of dishing and tilting using X-ray fluorescence
- Patent number 7,245,695
- Issue date Jul 17, 2007
- Jordan Valley Applied Radiation Ltd.
- Isaac Mazor
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MEASUREMENT OF SMALL FEATURES USING XRF
- Publication number 20160123909
- Publication date May 5, 2016
- JORDAN VALLEY SEMICONDUCTORS LTD.
- Matthew Wormington
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR ACCURATELY DETERMINING THE THICKNESS AND/OR ELEMENTAL CO...
- Publication number 20150330921
- Publication date Nov 19, 2015
- JORDAN VALLEY SEMICONDUCTORS LTD.
- Isaac Mazor
- G01 - MEASURING TESTING
Information Patent Application
ESTIMATION OF XRF INTENSITY FROM AN ARRAY OF MICRO-BUMPS
- Publication number 20140286473
- Publication date Sep 25, 2014
- JORDAN VALLEY SEMICONDUCTORS LTD.
- Alex Tokar
- G01 - MEASURING TESTING
Information Patent Application
X-ray inspection of bumps on a semiconductor substrate
- Publication number 20130089178
- Publication date Apr 11, 2013
- JORDAN VALLEY SEMICONDUCTORS LTD.
- Isaac Mazor
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Automated selection of x-ray reflectometry measurement locations
- Publication number 20090074141
- Publication date Mar 19, 2009
- JORDAN VALLEY SEMICONDUCTORS LTD.
- Isaac Mazor
- G01 - MEASURING TESTING
Information Patent Application
X-ray measurement of properties of nano-particles
- Publication number 20090067573
- Publication date Mar 12, 2009
- JORDAN VALLEY SEMICONDUCTORS
- Boris Yokhin
- G01 - MEASURING TESTING
Information Patent Application
Inspection of small features using X-Ray fluorescence
- Publication number 20080159475
- Publication date Jul 3, 2008
- JORDAN VALLEY SEMICONDUCTORS
- Isaac Mazor
- G01 - MEASURING TESTING
Information Patent Application
Automated selection of X-ray reflectometry measurement locations
- Publication number 20070274447
- Publication date Nov 29, 2007
- Isaac Mazor
- G01 - MEASURING TESTING
Information Patent Application
MULTI-DETECTOR EDXRD
- Publication number 20070058779
- Publication date Mar 15, 2007
- Boris YOKHIN
- G01 - MEASURING TESTING
Information Patent Application
Detection of dishing and tilting using x-ray fluorescence
- Publication number 20060227931
- Publication date Oct 12, 2006
- Isaac Mazor
- G01 - MEASURING TESTING

Person

Patents Grantslast 30 patents

Measurement of small features using XRF

Method for accurately determining the thickness and/or elemental co...

X-ray inspection of bumps on a semiconductor substrate

Estimation of XRF intensity from an array of micro-bumps

X-ray measurement of properties of nano-particles

Inspection of small features using X-ray fluorescence

Automated selection of X-ray reflectometry measurement locations

Multi-detector EDXRD

Detection of dishing and tilting using X-ray fluorescence

Patents Applicationslast 30 patents

MEASUREMENT OF SMALL FEATURES USING XRF

METHOD FOR ACCURATELY DETERMINING THE THICKNESS AND/OR ELEMENTAL CO...

ESTIMATION OF XRF INTENSITY FROM AN ARRAY OF MICRO-BUMPS

X-ray inspection of bumps on a semiconductor substrate

Automated selection of x-ray reflectometry measurement locations

X-ray measurement of properties of nano-particles

Inspection of small features using X-Ray fluorescence

Automated selection of X-ray reflectometry measurement locations

MULTI-DETECTOR EDXRD

Detection of dishing and tilting using x-ray fluorescence