Alexander A. Makarov

Person

Cheadle, GB

People

Patents Grantslast 30 patents

Information Patent Grant
Multi-electrode ion trap
- Patent number 8,592,750
- Issue date Nov 26, 2013
- Thermo Finnigan LLC.
- Alexander Alekseevich Makarov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometry
- Patent number 8,278,619
- Issue date Oct 2, 2012
- Thermo Finnigan LLC.
- Alexander Alekseevich Makarov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrostatic trap
- Patent number 8,198,581
- Issue date Jun 12, 2012
- Thermo Finnigan LLC.
- Alexander Makarov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer
- Patent number 8,153,963
- Issue date Apr 10, 2012
- Thermo Finnigan LLC.
- Alexander Alekseevich Makarov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
RF power supply for a mass spectrometer
- Patent number 8,030,613
- Issue date Oct 4, 2011
- Thermo Finnigan LLC.
- Alexander Alekseevich Makarov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer with looped ion path
- Patent number 7,932,487
- Issue date Apr 26, 2011
- Thermo Finnigan LLC.
- Viatcheslav V. Kovtoun
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multiple ion injection in mass spectrometry
- Patent number 7,880,136
- Issue date Feb 1, 2011
- Thermo Finnigan LLC.
- Alexander Alekseevich Makarov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion energy spread reduction for mass spectrometer
- Patent number 7,858,929
- Issue date Dec 28, 2010
- Thermo Fisher Scientific (Bremen) GmbH
- Alexander Makarov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion trapping
- Patent number 7,847,243
- Issue date Dec 7, 2010
- Thermo Finnigan LLC.
- Alexander Alekseevich Makarov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-electrode ion trap
- Patent number 7,767,960
- Issue date Aug 3, 2010
- Thermo Finnigan LLC.
- Alexander Alekseevich Makarov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer
- Patent number 7,759,638
- Issue date Jul 20, 2010
- Thermo Finnigan LLC.
- Alexander Alekseevich Makarov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometry
- Patent number 7,728,288
- Issue date Jun 1, 2010
- Thermo Finnigan LLC.
- Alexander Alekseevich Makarov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Orbital ion trap including an MS/MS method and apparatus
- Patent number 7,728,290
- Issue date Jun 1, 2010
- Thermo Finnigan LLC.
- Alexander Makarov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrostatic trap
- Patent number 7,714,283
- Issue date May 11, 2010
- Thermo Finnigan LLC.
- Alexander Makarov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for ion fragmentation by electron capture
- Patent number 7,612,335
- Issue date Nov 3, 2009
- Thermo Finnigan LLC.
- Alexander Alekseevich Makarov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Obtaining tandem mass spectrometry data for multiple parent ions in...
- Patent number 7,507,953
- Issue date Mar 24, 2009
- Thermo Finnigan LLC.
- Alexander Alekseevich Makarov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
RF power supply for a mass spectrometer
- Patent number 7,498,571
- Issue date Mar 3, 2009
- Thermo Finnigan LLC.
- Alexander Alekseevich Makarov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometry method and apparatus
- Patent number 7,425,699
- Issue date Sep 16, 2008
- Thermo Finnigan LLC.
- Alexander Makarov
- G01 - MEASURING TESTING
Information Patent Grant
All-mass MS/MS method and apparatus
- Patent number 7,399,962
- Issue date Jul 15, 2008
- Thermo Finnigan LLC.
- Alexander Makarov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Obtaining tandem mass spectrometry data for multiple parent ions in...
- Patent number 7,342,224
- Issue date Mar 11, 2008
- Thermo Finnigan LLC.
- Alexander Alekseevich Makarov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometry method and apparatus
- Patent number 7,265,344
- Issue date Sep 4, 2007
- Thermo Finnigan LLC.
- Alexander Makarov
- G01 - MEASURING TESTING
Information Patent Grant
Obtaining tandem mass spectrometry data for multiple parent ions in...
- Patent number 7,157,698
- Issue date Jan 2, 2007
- Thermo Finnigan, LLC
- Alexander Alekseevich Makarov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometry method and apparatus
- Patent number 6,998,609
- Issue date Feb 14, 2006
- Thermo Finnigan LLC.
- Alexander Makarov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometry method and apparatus
- Patent number 6,995,364
- Issue date Feb 7, 2006
- Thermo Finnigan LLC.
- Alexander Makarov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High dynamic range mass spectrometer
- Patent number 6,969,847
- Issue date Nov 29, 2005
- Thermo Finnigan LLC.
- Stephen Davis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Time of flight mass spectrometer and multiple detector therefor
- Patent number 6,940,066
- Issue date Sep 6, 2005
- Thermo Finnigan LLC.
- Alexander Alekseevich Makarov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-inlet mass spectrometer
- Patent number 6,914,240
- Issue date Jul 5, 2005
- Thermo Finnigan LLC.
- Roger Giles
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High throughput ion source for MALDI mass spectrometry
- Patent number 6,903,334
- Issue date Jun 7, 2005
- Thermo Finnigan LLC.
- Alexander A. Makarov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometry method and apparatus
- Patent number 6,872,938
- Issue date Mar 29, 2005
- Thermo Finnigan LLC.
- Alexander Makarov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High dynamic range mass spectrometer
- Patent number 6,864,479
- Issue date Mar 8, 2005
- Thermo Finnigan, LLC
- Stephen Davis
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
ELECTROSTATIC TRAP
- Publication number 20120248308
- Publication date Oct 4, 2012
- Alexander Makarov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION TRAPPING
- Publication number 20110057099
- Publication date Mar 10, 2011
- Alexander Alekseevich Makarov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTI-ELECTRODE ION TRAP
- Publication number 20100258714
- Publication date Oct 14, 2010
- Alexander Alekseevich Makarov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
RELATING TO A MASS SPECTROMETER
- Publication number 20100243880
- Publication date Sep 30, 2010
- Alexander Alekseevich Makarov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mass Spectrometry
- Publication number 20100193680
- Publication date Aug 5, 2010
- Alexander Alekseevich Makarov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTROSTATIC TRAP
- Publication number 20100181475
- Publication date Jul 22, 2010
- Alexander Makarov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER WITH ION STORAGE DEVICE
- Publication number 20090272895
- Publication date Nov 5, 2009
- Alexander Makarov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION ENERGY SPREAD REDUCTION FOR MASS SPECTROMETER
- Publication number 20090206248
- Publication date Aug 20, 2009
- Alexander Makarov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER WITH LOOPED ION PATH
- Publication number 20090179150
- Publication date Jul 16, 2009
- Viatcheslav V. Kovtoun
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
RF Power Supply for a Mass Spectrometer
- Publication number 20090127456
- Publication date May 21, 2009
- Alexander Alekseevich MAKAROV
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electrostatic Trap
- Publication number 20080315080
- Publication date Dec 25, 2008
- Alexander Makarov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ALL-MASS MS/MS METHOD AND APPARATUS
- Publication number 20080258053
- Publication date Oct 23, 2008
- Alexander Makarov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mass Spectrometer
- Publication number 20080224033
- Publication date Sep 18, 2008
- Alexander Alekseevich Makarov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Multiple Ion Injection in Mass Spectrometry
- Publication number 20080203288
- Publication date Aug 28, 2008
- Alexander Alekseevich Makarov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Multi-Electrode Ion Trap
- Publication number 20080203293
- Publication date Aug 28, 2008
- Alexander Alekseevich Makarov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mass Spectrometry
- Publication number 20080191129
- Publication date Aug 14, 2008
- Alexander Alekseevich Makarov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ion Trapping
- Publication number 20080156984
- Publication date Jul 3, 2008
- Alexander Alekseevich Makarov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Obtaining Tandem Mass Spectrometry Data for Multiple Parent Ions in...
- Publication number 20080111070
- Publication date May 15, 2008
- Alexander Alekseevich Makarov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
RF Power Supply for a Mass Spectrometer
- Publication number 20080048112
- Publication date Feb 28, 2008
- Thermo Finnigan LLC
- Alexander Alekseevich Makarov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETRY METHOD AND APPARATUS
- Publication number 20070273385
- Publication date Nov 29, 2007
- Alexander Makarov
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for ion fragmentation by electron capture
- Publication number 20070138386
- Publication date Jun 21, 2007
- Alexander Alekseevich Makarov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
All-mass ms/ms method and apparatus
- Publication number 20070023629
- Publication date Feb 1, 2007
- Alexander Makarov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Obtaining tandem mass spectrometry data for multiple parent ions in...
- Publication number 20060284080
- Publication date Dec 21, 2006
- Alexander Alekseevich Makarov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mass spectrometry method and apparatus
- Publication number 20060124845
- Publication date Jun 15, 2006
- Alexander Makarov
- G01 - MEASURING TESTING
Information Patent Application
Mass spectrometry method and apparatus
- Publication number 20050167585
- Publication date Aug 4, 2005
- Alexander Makarov
- B82 - NANO-TECHNOLOGY
Information Patent Application
High dynamic range mass spectrometer
- Publication number 20050145788
- Publication date Jul 7, 2005
- Stephen Davis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mass spectrometry method and apparatus
- Publication number 20050121609
- Publication date Jun 9, 2005
- Alexander Makarov
- B82 - NANO-TECHNOLOGY
Information Patent Application
Obtaining tandem mass spectrometry data for multiple parent ions in...
- Publication number 20040222369
- Publication date Nov 11, 2004
- Thermo Finnigan LLC
- Alexander Alekseevich Makarov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Time of flight mass spectrometer and multiple detector therefor
- Publication number 20040149900
- Publication date Aug 5, 2004
- Alexander Alekseevich Makarov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mass spectrometry method and apparatus
- Publication number 20040108450
- Publication date Jun 10, 2004
- Alexander Makarov
- B82 - NANO-TECHNOLOGY

Alexander A. Makarov

Person

Patents Grantslast 30 patents

Multi-electrode ion trap

Mass spectrometry

Electrostatic trap

Mass spectrometer

RF power supply for a mass spectrometer

Mass spectrometer with looped ion path

Multiple ion injection in mass spectrometry

Ion energy spread reduction for mass spectrometer

Ion trapping

Multi-electrode ion trap

Mass spectrometer

Mass spectrometry

Orbital ion trap including an MS/MS method and apparatus

Electrostatic trap

Method and apparatus for ion fragmentation by electron capture

Obtaining tandem mass spectrometry data for multiple parent ions in...

RF power supply for a mass spectrometer

Mass spectrometry method and apparatus

All-mass MS/MS method and apparatus

Obtaining tandem mass spectrometry data for multiple parent ions in...

Mass spectrometry method and apparatus

Obtaining tandem mass spectrometry data for multiple parent ions in...

Mass spectrometry method and apparatus

Mass spectrometry method and apparatus

High dynamic range mass spectrometer

Time of flight mass spectrometer and multiple detector therefor

Multi-inlet mass spectrometer

High throughput ion source for MALDI mass spectrometry

Mass spectrometry method and apparatus

High dynamic range mass spectrometer

Patents Applicationslast 30 patents

ELECTROSTATIC TRAP

ION TRAPPING

MULTI-ELECTRODE ION TRAP

RELATING TO A MASS SPECTROMETER

Mass Spectrometry

ELECTROSTATIC TRAP

MASS SPECTROMETER WITH ION STORAGE DEVICE

ION ENERGY SPREAD REDUCTION FOR MASS SPECTROMETER

MASS SPECTROMETER WITH LOOPED ION PATH

RF Power Supply for a Mass Spectrometer

Electrostatic Trap

ALL-MASS MS/MS METHOD AND APPARATUS

Mass Spectrometer

Multiple Ion Injection in Mass Spectrometry

Multi-Electrode Ion Trap

Mass Spectrometry

Ion Trapping

Obtaining Tandem Mass Spectrometry Data for Multiple Parent Ions in...

RF Power Supply for a Mass Spectrometer

MASS SPECTROMETRY METHOD AND APPARATUS

Method and apparatus for ion fragmentation by electron capture

All-mass ms/ms method and apparatus

Obtaining tandem mass spectrometry data for multiple parent ions in...

Mass spectrometry method and apparatus

Mass spectrometry method and apparatus

High dynamic range mass spectrometer

Mass spectrometry method and apparatus

Obtaining tandem mass spectrometry data for multiple parent ions in...

Time of flight mass spectrometer and multiple detector therefor

Mass spectrometry method and apparatus