ALEXANDER B. HOEFLER

Person

AUSTIN, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
Integrated circuit having test circuitry for memory sub-systems
- Patent number 12,181,522
- Issue date Dec 31, 2024
- NXP USA, INC.
- Alexander Hoefler
- G11 - INFORMATION STORAGE
Information Patent Grant
Physically unclonable function having source bias transistors
- Patent number 11,233,663
- Issue date Jan 25, 2022
- NXP USA, INC.
- Alexander Hoefler
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Data processing system and method for generating a digital code wit...
- Patent number 11,056,161
- Issue date Jul 6, 2021
- NXP USA, INC.
- Nihaar N. Mahatme
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Physically unclonable function and method for generating a digital...
- Patent number 10,574,469
- Issue date Feb 25, 2020
- NXP USA, INC.
- Brad John Garni
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Memory system having a source bias circuit
- Patent number 10,446,225
- Issue date Oct 15, 2019
- NXP USA, INC.
- Alexander Hoefler
- G11 - INFORMATION STORAGE
Information Patent Grant
Data processing system with built-in self-test and method therefor
- Patent number 10,417,104
- Issue date Sep 17, 2019
- NXP USA, INC.
- Colin MacDonald
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Memory having one time programmable (OTP) elements and a method of...
- Patent number 10,127,998
- Issue date Nov 13, 2018
- NXP USA, INC.
- Alexander B. Hoefler
- G11 - INFORMATION STORAGE
Information Patent Grant
SRAM based physically unclonable function and method for generating...
- Patent number 9,947,391
- Issue date Apr 17, 2018
- NXP USA, INC.
- Nihaar N. Mahatme
- G11 - INFORMATION STORAGE
Information Patent Grant
Write assist circuit and method therefor
- Patent number 9,691,451
- Issue date Jun 27, 2017
- NXP USA, INC.
- Scott Ives Remington
- G11 - INFORMATION STORAGE
Information Patent Grant
Low swing flip-flop with reduced leakage slave latch
- Patent number 9,425,775
- Issue date Aug 23, 2016
- FREESCALE SEMICONDUCTOR, INC.
- Anis M. Jarrar
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Method and apparatus for a tunable driver circuit
- Patent number 9,407,263
- Issue date Aug 2, 2016
- FREESCALE SEMICONDUCTOR, INC.
- Alexander B. Hoefler
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Address fault detection circuit
- Patent number 9,263,152
- Issue date Feb 16, 2016
- FREESCALE SEMICONDUCTOR, INC.
- Alexander B. Hoefler
- G11 - INFORMATION STORAGE
Information Patent Grant
Low leakage CMOS cell with low voltage swing
- Patent number 9,264,040
- Issue date Feb 16, 2016
- FREESCALE SEMICONDUCTOR, INC.
- Savithri Sundareswaran
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Level shifter with improved operation
- Patent number 9,136,845
- Issue date Sep 15, 2015
- FREESCALE SEMICONDUCTOR, INC.
- Sayeed Ahmed Badrudduza
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Fuse circuit with test mode
- Patent number 9,117,534
- Issue date Aug 25, 2015
- FREESCALE SEMICONDUCTOR, INC.
- Alexander B. Hoefler
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory having a latching sense amplifier resistant to negative bias...
- Patent number 8,659,322
- Issue date Feb 25, 2014
- FREESCALE SEMICONDUCTOR, INC.
- Alexander B. Hoefler
- G11 - INFORMATION STORAGE
Information Patent Grant
Random number generator
- Patent number 8,380,768
- Issue date Feb 19, 2013
- FREESCALE SEMICONDUCTOR, INC.
- Alexander B. Hoefler
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Word line fault detection
- Patent number 8,379,468
- Issue date Feb 19, 2013
- FREESCALE SEMICONDUCTOR, INC.
- Ravindraraj Ramaraju
- G11 - INFORMATION STORAGE
Information Patent Grant
Circuit for verifying the write enable of a one time programmable m...
- Patent number 8,254,186
- Issue date Aug 28, 2012
- FREESCALE SEMICONDUCTOR, INC.
- Alexander B. Hoefler
- G11 - INFORMATION STORAGE
Information Patent Grant
Method of forming an integrated circuit
- Patent number 7,824,988
- Issue date Nov 2, 2010
- FREESCALE SEMICONDUCTOR, INC.
- Alexander Hoefler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of programming a memory having electrically programmable fuses
- Patent number 7,804,701
- Issue date Sep 28, 2010
- FREESCALE SEMICONDUCTOR, INC.
- Alexander Hoefler
- G11 - INFORMATION STORAGE
Information Patent Grant
Level detect circuit
- Patent number 7,787,323
- Issue date Aug 31, 2010
- FREESCALE SEMICONDUCTOR, INC.
- Lawrence N. Herr
- G11 - INFORMATION STORAGE
Information Patent Grant
Circuit and method for optimizing memory sense amplifier timing
- Patent number 7,733,711
- Issue date Jun 8, 2010
- FREESCALE SEMICONDUCTOR, INC.
- James D. Burnett
- G11 - INFORMATION STORAGE
Information Patent Grant
Antifuse one time programmable memory array and method of manufacture
- Patent number 7,678,620
- Issue date Mar 16, 2010
- FREESCALE SEMICONDUCTOR, INC.
- Alexander B. Hoefler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated circuit fuse array
- Patent number 7,583,554
- Issue date Sep 1, 2009
- FREESCALE SEMICONDUCTOR, INC.
- Alexander B. Hoefler
- G11 - INFORMATION STORAGE
Information Patent Grant
Programmable fuse with silicon germanium
- Patent number 7,575,958
- Issue date Aug 18, 2009
- FREESCALE SEMICONDUCTOR, INC.
- Alexander B. Hoefler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scannable flip-flop with non-volatile storage element and method
- Patent number 7,560,965
- Issue date Jul 14, 2009
- FREESCALE SEMICONDUCTOR, INC.
- Jeffrey W. Waldrip
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor storage device
- Patent number 7,518,177
- Issue date Apr 14, 2009
- FREESCALE SEMICONDUCTOR, INC.
- Alexander B. Hoefler
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory with fault tolerant reference circuitry
- Patent number 7,444,557
- Issue date Oct 28, 2008
- FREESCALE SEMICONDUCTOR, INC.
- Alexander B. Hoefler
- G11 - INFORMATION STORAGE
Information Patent Grant
Non-volatile memory device with improved data retention and method...
- Patent number 7,432,547
- Issue date Oct 7, 2008
- FREESCALE SEMICONDUCTOR, INC.
- Gowrishankar L. Chindalore
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
INTEGRATED CIRCUIT HAVING TEST CIRCUITRY FOR MEMORY SUB-SYSTEMS
- Publication number 20240142520
- Publication date May 2, 2024
- NXP USA, Inc.
- Alexander Hoefler
- G01 - MEASURING TESTING
Information Patent Application
VOLTAGE GENERATION CIRCUIT FOR SRAM
- Publication number 20240062791
- Publication date Feb 22, 2024
- NXP B.V.
- Hubert Martin Bode
- G11 - INFORMATION STORAGE
Information Patent Application
PHYSICALLY UNCLONABLE FUNCTION HAVING SOURCE BIAS TRANSISTORS
- Publication number 20220029834
- Publication date Jan 27, 2022
- NXP USA, Inc.
- Alexander Hoefler
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
DATA PROCESSING SYSTEM AND METHOD FOR GENERATING A DIGITAL CODE WIT...
- Publication number 20210027814
- Publication date Jan 28, 2021
- NXP USA, Inc.
- Nihaar N. Mahatme
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
MEMORY SYSTEM HAVING A SOURCE BIAS CIRCUIT
- Publication number 20190333575
- Publication date Oct 31, 2019
- NXP USA, Inc.
- Alexander Hoefler
- G11 - INFORMATION STORAGE
Information Patent Application
DATA PROCESSING SYSTEM WITH BUILT-IN SELF-TEST AND METHOD THEREFOR
- Publication number 20170082686
- Publication date Mar 23, 2017
- FREESCALE SEMICONDUCTOR, INC.
- COLIN MACDONALD
- G01 - MEASURING TESTING
Information Patent Application
LOW SWING FLIP-FLOP WITH REDUCED LEAKAGE SLAVE LATCH
- Publication number 20160072484
- Publication date Mar 10, 2016
- FREESCALE SEMICONDUCTOR, INC.
- Anis M. Jarrar
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Address Fault Detection Circuit
- Publication number 20160027529
- Publication date Jan 28, 2016
- FREESCALE SEMICONDUCTOR, INC.
- Alexander B. Hoefler
- G11 - INFORMATION STORAGE
Information Patent Application
Level Shifter With Improved Operation
- Publication number 20150229307
- Publication date Aug 13, 2015
- Sayeed Ahmed Badrudduza
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
FUSE CIRCUIT WITH TEST MODE
- Publication number 20150206594
- Publication date Jul 23, 2015
- Alexander B. Hoefler
- G11 - INFORMATION STORAGE
Information Patent Application
LOW LEAKAGE CMOS CELL WITH LOW VOLTAGE SWING
- Publication number 20150180452
- Publication date Jun 25, 2015
- FREESCALE SEMICONDUCTOR, INC.
- Savithri Sundareswaran
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
MEMORY HAVING ONE TIME PROGRAMMABLE (OTP) ELEMENTS AND A METHOD OF...
- Publication number 20150085557
- Publication date Mar 26, 2015
- Alexander B. Hoefler
- G11 - INFORMATION STORAGE
Information Patent Application
METHOD AND APPARATUS FOR A TUNABLE DRIVER CIRCUIT
- Publication number 20140117953
- Publication date May 1, 2014
- FREESCALE SEMICONDUCTOR, INC.
- ALEXANDER B. HOEFLER
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Application
WORD LINE FAULT DETECTION
- Publication number 20120327699
- Publication date Dec 27, 2012
- RAVINDRARAJ RAMARAJU
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY HAVING A LATCHING SENSE AMPLIFIER RESISTANT TO NEGATIVE BIAS...
- Publication number 20120194222
- Publication date Aug 2, 2012
- Alexander B. Hoefler
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
CIRCUIT FOR VERIFYING THE WRITE ENABLE OF A ONE TIME PROGRAMMABLE M...
- Publication number 20110267869
- Publication date Nov 3, 2011
- Alexander B. Hoefler
- G11 - INFORMATION STORAGE
Information Patent Application
RANDOM NUMBER GENERATOR
- Publication number 20100198896
- Publication date Aug 5, 2010
- Alexander B. Hoefler
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF FORMING AN INTEGRATED CIRCUIT
- Publication number 20100181629
- Publication date Jul 22, 2010
- Alexander Hoefler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CIRCUIT AND METHOD FOR OPTIMIZING MEMORY SENSE AMPLIFIER TIMING
- Publication number 20100061162
- Publication date Mar 11, 2010
- James D. Burnett
- G11 - INFORMATION STORAGE
Information Patent Application
METHOD OF PROGRAMMING A MEMORY HAVING ELECTRICALLY PROGRAMMABLE FUSES
- Publication number 20090219747
- Publication date Sep 3, 2009
- Alexander Hoefler
- G11 - INFORMATION STORAGE
Information Patent Application
SCANNABLE FLIP-FLOP WITH NON-VOLATILE STORAGE ELEMENT AND METHOD
- Publication number 20080265962
- Publication date Oct 30, 2008
- Jeffrey W. Waldrip
- G01 - MEASURING TESTING
Information Patent Application
LEVEL DETECT CIRCUIT
- Publication number 20080266994
- Publication date Oct 30, 2008
- Lawrence N. Herr
- G11 - INFORMATION STORAGE
Information Patent Application
INTEGRATED CIRCUIT FUSE ARRAY
- Publication number 20080212387
- Publication date Sep 4, 2008
- Alexander B. Hoefler
- G11 - INFORMATION STORAGE
Information Patent Application
INTEGRATED CIRCUIT FUSE ARRAY
- Publication number 20080212388
- Publication date Sep 4, 2008
- Alexander B. Hoefler
- G11 - INFORMATION STORAGE
Information Patent Application
ANTIFUSE ONE TIME PROGRAMMABLE MEMORY ARRAY AND METHOD OF MANUFACTURE
- Publication number 20080085574
- Publication date Apr 10, 2008
- Alexander B. Hoefler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR STORAGE DEVICE
- Publication number 20080001199
- Publication date Jan 3, 2008
- FREESCALE SEMICONDUCTOR, INC.
- Alexander B. Hoefler
- G11 - INFORMATION STORAGE
Information Patent Application
Programmable cell
- Publication number 20070237018
- Publication date Oct 11, 2007
- FREESCALE SEMICONDUCTOR, INC.
- Prashant U. Kenkare
- G11 - INFORMATION STORAGE
Information Patent Application
Semiconductor storage device
- Publication number 20070211516
- Publication date Sep 13, 2007
- Alexander B. Hoefler
- G11 - INFORMATION STORAGE
Information Patent Application
Method for producing two gates controlling the same channel
- Publication number 20070173024
- Publication date Jul 26, 2007
- Sinan Goktepeli
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Programmable fuse with silicon germanium
- Publication number 20070082431
- Publication date Apr 12, 2007
- Alexander B. Hoefler
- H01 - BASIC ELECTRIC ELEMENTS

ALEXANDER B. HOEFLER

Person

Patents Grantslast 30 patents

Integrated circuit having test circuitry for memory sub-systems

Physically unclonable function having source bias transistors

Data processing system and method for generating a digital code wit...

Physically unclonable function and method for generating a digital...

Memory system having a source bias circuit

Data processing system with built-in self-test and method therefor

Memory having one time programmable (OTP) elements and a method of...

SRAM based physically unclonable function and method for generating...

Write assist circuit and method therefor

Low swing flip-flop with reduced leakage slave latch

Method and apparatus for a tunable driver circuit

Address fault detection circuit

Low leakage CMOS cell with low voltage swing

Level shifter with improved operation

Fuse circuit with test mode

Memory having a latching sense amplifier resistant to negative bias...

Random number generator

Word line fault detection

Circuit for verifying the write enable of a one time programmable m...

Method of forming an integrated circuit

Method of programming a memory having electrically programmable fuses

Level detect circuit

Circuit and method for optimizing memory sense amplifier timing

Antifuse one time programmable memory array and method of manufacture

Integrated circuit fuse array

Programmable fuse with silicon germanium

Scannable flip-flop with non-volatile storage element and method

Semiconductor storage device

Memory with fault tolerant reference circuitry

Non-volatile memory device with improved data retention and method...

Patents Applicationslast 30 patents

INTEGRATED CIRCUIT HAVING TEST CIRCUITRY FOR MEMORY SUB-SYSTEMS

VOLTAGE GENERATION CIRCUIT FOR SRAM

PHYSICALLY UNCLONABLE FUNCTION HAVING SOURCE BIAS TRANSISTORS

DATA PROCESSING SYSTEM AND METHOD FOR GENERATING A DIGITAL CODE WIT...

MEMORY SYSTEM HAVING A SOURCE BIAS CIRCUIT

DATA PROCESSING SYSTEM WITH BUILT-IN SELF-TEST AND METHOD THEREFOR

LOW SWING FLIP-FLOP WITH REDUCED LEAKAGE SLAVE LATCH

Address Fault Detection Circuit

Level Shifter With Improved Operation

FUSE CIRCUIT WITH TEST MODE

LOW LEAKAGE CMOS CELL WITH LOW VOLTAGE SWING

MEMORY HAVING ONE TIME PROGRAMMABLE (OTP) ELEMENTS AND A METHOD OF...

METHOD AND APPARATUS FOR A TUNABLE DRIVER CIRCUIT

WORD LINE FAULT DETECTION

MEMORY HAVING A LATCHING SENSE AMPLIFIER RESISTANT TO NEGATIVE BIAS...

CIRCUIT FOR VERIFYING THE WRITE ENABLE OF A ONE TIME PROGRAMMABLE M...

RANDOM NUMBER GENERATOR

METHOD OF FORMING AN INTEGRATED CIRCUIT

CIRCUIT AND METHOD FOR OPTIMIZING MEMORY SENSE AMPLIFIER TIMING

METHOD OF PROGRAMMING A MEMORY HAVING ELECTRICALLY PROGRAMMABLE FUSES

SCANNABLE FLIP-FLOP WITH NON-VOLATILE STORAGE ELEMENT AND METHOD

LEVEL DETECT CIRCUIT

INTEGRATED CIRCUIT FUSE ARRAY

INTEGRATED CIRCUIT FUSE ARRAY

ANTIFUSE ONE TIME PROGRAMMABLE MEMORY ARRAY AND METHOD OF MANUFACTURE

SEMICONDUCTOR STORAGE DEVICE

Programmable cell

Semiconductor storage device

Method for producing two gates controlling the same channel

Programmable fuse with silicon germanium