Alexander Belyaev

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Wayland, MA, US

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Patents Grantslast 30 patents

Information Patent Grant
Specimen topography reconstruction
- Patent number 7,136,519
- Issue date Nov 14, 2006
- ADE Corporation
- Jaydeep Sinha
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Wafer testing and self-calibration system
- Patent number 5,642,298
- Issue date Jun 24, 1997
- ADE Corporation
- Roy E. Mallory
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Specimen topography reconstruction
- Publication number 20020177980
- Publication date Nov 28, 2002
- Jaydeep Sinha
- G06 - COMPUTING CALCULATING COUNTING