Alexander Belyaev

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Mountain View, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Methods and systems for inspection of a wafer
- Patent number 7,554,656
- Issue date Jun 30, 2009
- KLA-Tencor Technologies Corp.
- David Shortt
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for detecting pinholes in a film formed on a wa...
- Patent number 7,528,944
- Issue date May 5, 2009
- KLA-Tencor Technologies Corporation
- David Chen
- G01 - MEASURING TESTING
Information Patent Grant
Computer-implemented methods and systems for determining a configur...
- Patent number 7,436,505
- Issue date Oct 14, 2008
- KLA-Tencor Technologies Corp.
- Alexander Belyaev
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHODS AND SYSTEMS FOR DETECTING PINHOLES IN A FILM FORMED ON A WA...
- Publication number 20080018887
- Publication date Jan 24, 2008
- David Chen
- G01 - MEASURING TESTING
Information Patent Application
Computer-Implemented Methods and Systems for Determining a Configur...
- Publication number 20070229809
- Publication date Oct 4, 2007
- KLA-TENCOR TECHNOLOGIES CORP.
- Alexander Belyaev
- G01 - MEASURING TESTING
Information Patent Application
Methods and systems for inspection of a wafer
- Publication number 20070081151
- Publication date Apr 12, 2007
- David Shortt
- G01 - MEASURING TESTING