Alexander Biewenga

Follow

Person

Eindhoven, NL

People

Patents Grantslast 30 patents

Information Patent Grant
Method for testing a partially assembled multi-die device, integrat...
- Patent number 8,829,940
- Issue date Sep 9, 2014
- NXP, B.V.
- Fransciscus Geradus Marie de Jong
- G01 - MEASURING TESTING
Information Patent Grant
Testable integrated circuit, system in package and test instruction...
- Patent number 8,653,847
- Issue date Feb 18, 2014
- NXP, B.V.
- Fransciscus G. M. De Jong
- G01 - MEASURING TESTING
Information Patent Grant
Testable integrated circuit, system in package and test instruction...
- Patent number 7,948,243
- Issue date May 24, 2011
- NXP B.V.
- Fransciscus G. M. De Jong
- G01 - MEASURING TESTING
Information Patent Grant
Electronic circuit and method for testing
- Patent number 6,883,129
- Issue date Apr 19, 2005
- Koninklijke Philips Electronics N.V.
- Alexander Sebastian Biewenga
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR TESTING A PARTIALLY ASSEMBLED MULTI-DIE DEVICE, INTEGRAT...
- Publication number 20120126846
- Publication date May 24, 2012
- NXP B.V.
- Franciscus Gerardus Maria De Jong
- G01 - MEASURING TESTING
Information Patent Application
TESTABLE INTEGRATED CIRCUIT, SYSTEM IN PACKAGE AND TEST INSTRUCTION...
- Publication number 20110267093
- Publication date Nov 3, 2011
- NXP B.V.
- Fransciscus G. M., De Jong
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT WITH TEST ARRANGEMENT, INTEGRATED CIRCUIT ARRANG...
- Publication number 20110018550
- Publication date Jan 27, 2011
- NXP B.V.
- Franciscus Geradus Maria De Jong
- G01 - MEASURING TESTING
Information Patent Application
TESTABLE INTEGRATED CIRCUIT, SYSTEM IN PACKAGE AND TEST INSTRUCTION...
- Publication number 20090309609
- Publication date Dec 17, 2009
- NXP B.V.
- Fransciscus G., M. De Jong
- G01 - MEASURING TESTING
Information Patent Application
Apparatus with a test interface
- Publication number 20040177300
- Publication date Sep 9, 2004
- Alexander Sebastian Biewenga
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Electronic circuit and method for testing
- Publication number 20030051198
- Publication date Mar 13, 2003
- Alexander Sebastian Biewenga
- G01 - MEASURING TESTING