Alexander Brandorff

Person

New Milford, CT, US

People

Patents Grantslast 30 patents

Information Patent Grant
Methods of fabricating probe cards including nanotubes
- Patent number 10,234,480
- Issue date Mar 19, 2019
- Wentworth Laboratories, Inc.
- Alexander Brandorff
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Methods of fabricating probe cards including nanotubes
- Patent number 9,851,378
- Issue date Dec 26, 2017
- Wentworth Laboratories Inc.
- Alexander Brandorff
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Probe card assemblies and probe pins including carbon nanotubes
- Patent number 9,267,968
- Issue date Feb 23, 2016
- Wentworth Laboratories, Inc.
- Alexander Brandorff
- G01 - MEASURING TESTING
Information Patent Grant
Die design with integrated assembly aid
- Patent number 7,649,372
- Issue date Jan 19, 2010
- Wentworth Laboratories, Inc.
- Robert L. Rogers
- G01 - MEASURING TESTING
Information Patent Grant
Multi-offset die head
- Patent number 7,554,348
- Issue date Jun 30, 2009
- Wentworth Laboratories, Inc.
- Alexander Brandorff
- G01 - MEASURING TESTING
Information Patent Grant
Die design with integrated assembly aid
- Patent number 7,388,392
- Issue date Jun 17, 2008
- Wentworth Laboratories, Inc.
- Alexander Brandorff
- G01 - MEASURING TESTING
Information Patent Grant
Die design with integrated assembly aid
- Patent number 7,282,936
- Issue date Oct 16, 2007
- Wentworth Laboratories, Inc.
- Alexander Brandorff
- G01 - MEASURING TESTING
Information Patent Grant
Planarizing interposer for thermal compensation of a probe card
- Patent number 6,756,797
- Issue date Jun 29, 2004
- Wentworth Laboratories Inc.
- Alexander Brandorff
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for weighing objects
- Patent number 5,561,274
- Issue date Oct 1, 1996
- Intel Corporation
- Alexander Brandorff
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for weighing rigid and non-rigid objects
- Patent number 5,408,054
- Issue date Apr 18, 1995
- United Parcel Service of America, Inc.
- Alexander Brandorff
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for illumination and imaging of a surface usin...
- Patent number 5,408,084
- Issue date Apr 18, 1995
- United Parcel Service of America, Inc.
- Alexander Brandorff
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Robotic gripper for handling objects of various sizes
- Patent number 5,364,146
- Issue date Nov 15, 1994
- United Parcel Service of America, Inc.
- Alexander Brandorff
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Grant
Method and apparatus for weighing objects
- Patent number 5,340,950
- Issue date Aug 23, 1994
- United Parcel Service of America, Inc.
- Alexander Brandorff
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHODS OF FABRICATING PROBE CARDS INCLUDING NANOTUBES
- Publication number 20180045757
- Publication date Feb 15, 2018
- Wentworth Laboratories, Inc.
- Alexander Brandorff
- B82 - NANO-TECHNOLOGY
Information Patent Application
Probe Card Assemblies And Probe Pins Including Carbon Nanotubes
- Publication number 20140028342
- Publication date Jan 30, 2014
- Alexander Brandorff
- G01 - MEASURING TESTING
Information Patent Application
Probe Cards Including Nanotube Probes and Methods of Fabricating
- Publication number 20120199280
- Publication date Aug 9, 2012
- Alexander Brandorff
- G01 - MEASURING TESTING
Information Patent Application
DIE DESIGN WITH INTEGRATED ASSEMBLY AID
- Publication number 20090096474
- Publication date Apr 16, 2009
- Robert L. Rogers
- G01 - MEASURING TESTING
Information Patent Application
MULTI-OFFSET DIE HEAD
- Publication number 20090002009
- Publication date Jan 1, 2009
- Wentworth Laboratories, Inc.
- Alexander Brandorff
- G01 - MEASURING TESTING
Information Patent Application
DIE DESIGN WITH INTEGRATED ASSEMBLY AID
- Publication number 20080084227
- Publication date Apr 10, 2008
- Alexander Brandorff
- G01 - MEASURING TESTING
Information Patent Application
Die design with integrated assembly aid
- Publication number 20050110510
- Publication date May 26, 2005
- Wentworth Laboratories, Inc., a corporation of the State of Connecticut
- Alexander Brandorff
- G01 - MEASURING TESTING
Information Patent Application
Planarizing interposer
- Publication number 20020109514
- Publication date Aug 15, 2002
- Wentworth Laboratories, Inc.
- Alexander Brandorff
- G01 - MEASURING TESTING

Alexander Brandorff

Person

Patents Grantslast 30 patents

Methods of fabricating probe cards including nanotubes

Methods of fabricating probe cards including nanotubes

Probe card assemblies and probe pins including carbon nanotubes

Die design with integrated assembly aid

Multi-offset die head

Die design with integrated assembly aid

Die design with integrated assembly aid

Planarizing interposer for thermal compensation of a probe card

Apparatus for weighing objects

Method and apparatus for weighing rigid and non-rigid objects

Method and apparatus for illumination and imaging of a surface usin...

Robotic gripper for handling objects of various sizes

Method and apparatus for weighing objects

Patents Applicationslast 30 patents

METHODS OF FABRICATING PROBE CARDS INCLUDING NANOTUBES

Probe Card Assemblies And Probe Pins Including Carbon Nanotubes

Probe Cards Including Nanotube Probes and Methods of Fabricating

DIE DESIGN WITH INTEGRATED ASSEMBLY AID

MULTI-OFFSET DIE HEAD

DIE DESIGN WITH INTEGRATED ASSEMBLY AID

Die design with integrated assembly aid

Planarizing interposer