Alexander C. Wei

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Poughkeepsie, NY, US

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Patents Grantslast 30 patents

Information Patent Grant
Test pattern for contour calibration in OPC model build
- Patent number 8,234,601
- Issue date Jul 31, 2012
- International Business Machines Corporation
- Amr A. Abdo
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
System and method for implementing optical rule checking to identif...
- Patent number 7,765,518
- Issue date Jul 27, 2010
- International Business Machines Corporation
- Ramon E De La Cruz
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
Test Pattern for Contour Calibration in OPC Model Build
- Publication number 20110283244
- Publication date Nov 17, 2011
- International Business Machines Corporation
- Amr Y. Abdo
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
SYSTEM AND METHOD FOR IMPLEMENTING OPTICAL RULE CHECKING TO IDENTIF...
- Publication number 20090241085
- Publication date Sep 24, 2009
- International Business Machines Corporation
- Ramon E. De La Cruz
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method Of Determining Photomask Inspection Capabilities
- Publication number 20070174012
- Publication date Jul 26, 2007
- Karen D. Badger
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY