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Alexander Dikopoltsev
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Haifa, IL
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Patents Grants
last 30 patents
Information
Patent Grant
Small-angle x-ray scatterometry
Patent number
11,703,464
Issue date
Jul 18, 2023
BRUKER TECHNOLOGIES LTD.
Alex Dikopoltsev
G01 - MEASURING TESTING
Information
Patent Grant
Small-angle x-ray scatterometry
Patent number
11,181,490
Issue date
Nov 23, 2021
BRUKER TECHNOLOGIES LTD.
Alex Dikopoltsev
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for X-ray scatterometry
Patent number
11,169,099
Issue date
Nov 9, 2021
BRUKER TECHNOLOGIES LTD.
Alex Krokhmal
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for X-ray scatterometry
Patent number
10,684,238
Issue date
Jun 16, 2020
BRUKER TECHNOLOGIES LTD.
Alex Krokhmal
G01 - MEASURING TESTING
Information
Patent Grant
Electro-optic transceiver module with wavelength compensation
Patent number
10,177,841
Issue date
Jan 8, 2019
Mellanox Technologies, Ltd.
Elad Mentovich
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Measurement of small features using XRF
Patent number
9,829,448
Issue date
Nov 28, 2017
BRUKER JV ISRAEL LTD.
Matthew Wormington
G01 - MEASURING TESTING
Information
Patent Grant
X-ray scatterometry apparatus
Patent number
9,606,073
Issue date
Mar 28, 2017
BRUKER JV ISRAEL LTD.
Isaac Mazor
G01 - MEASURING TESTING
Information
Patent Grant
Estimation of XRF intensity from an array of micro-bumps
Patent number
9,389,192
Issue date
Jul 12, 2016
BRUKER JV ISRAEL LTD.
Alex Tokar
G01 - MEASURING TESTING
Information
Patent Grant
Automated selection of X-ray reflectometry measurement locations
Patent number
7,649,978
Issue date
Jan 19, 2010
Jordan Valley Semiconductors Ltd.
Isaac Mazor
G01 - MEASURING TESTING
Information
Patent Grant
Overlay metrology using X-rays
Patent number
7,481,579
Issue date
Jan 27, 2009
Jordan Valley Applied Radiation Ltd.
Boris Yokhin
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Detection of dishing and tilting using X-ray fluorescence
Patent number
7,245,695
Issue date
Jul 17, 2007
Jordan Valley Applied Radiation Ltd.
Isaac Mazor
G01 - MEASURING TESTING
Information
Patent Grant
X-ray reflectometry of thin film layers with enhanced accuracy
Patent number
7,130,376
Issue date
Oct 31, 2006
Jordan Valley Applied Radiation Ltd.
David Berman
G01 - MEASURING TESTING
Information
Patent Grant
Material analysis using multiple X-ray reflectometry models
Patent number
7,103,142
Issue date
Sep 5, 2006
Jordan Valley Applied Radiation Ltd.
Dileep Agnihotri
G01 - MEASURING TESTING
Information
Patent Grant
X-ray reflectometry of thin film layers with enhanced accuracy
Patent number
7,062,013
Issue date
Jun 13, 2006
Jordan Valley Applied Radiation Ltd.
David Berman
G01 - MEASURING TESTING
Information
Patent Grant
XRR detector readout processing
Patent number
6,895,071
Issue date
May 17, 2005
Jordon Valley Applied Radiation, Ltd.
Boris Yokhin
G01 - MEASURING TESTING
Information
Patent Grant
X-ray reflectometry with small-angle scattering measurement
Patent number
6,895,075
Issue date
May 17, 2005
Jordan Valley Applied Radiation Ltd.
Boris Yokhin
G01 - MEASURING TESTING
Information
Patent Grant
X-ray reflectometer
Patent number
6,512,814
Issue date
Jan 28, 2003
Jordan Valley Applied Radiation
Boris Yokhin
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Small-angle x-ray scatterometry
Publication number
20240077435
Publication date
Mar 7, 2024
BRUKER TECHNOLOGIES LTD.
Alex Dikopoltsev
G01 - MEASURING TESTING
Information
Patent Application
TOPOLOGIC INSULATOR SURFACE EMITTING LASER SYSTEM
Publication number
20230223735
Publication date
Jul 13, 2023
Technion Research & Development Foundation Ltd.
Mordechai SEGEV
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Small-Angle X-Ray Scatterometry
Publication number
20220042933
Publication date
Feb 10, 2022
BRUKER TECHNOLOGIES LTD.
Alex Dikopoltsev
G01 - MEASURING TESTING
Information
Patent Application
Small-angle x-ray scatterometry
Publication number
20210285898
Publication date
Sep 16, 2021
BRUKER TECHNOLOGIES LTD.
Alex Dikopoltsev
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR X-RAY SCATTEROMETRY
Publication number
20190339215
Publication date
Nov 7, 2019
BRUKER JV ISRAEL LTD.
Alex Krokhmal
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ELECTRO-OPTIC TRANSCEIVER MODULE WITH WAVELENGTH COMPENSATION
Publication number
20170288770
Publication date
Oct 5, 2017
MELLANOX TECHNOLOGIES, LTD.
Elad Mentovich
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
METHOD AND APPARATUS FOR X-RAY SCATTEROMETRY
Publication number
20170199136
Publication date
Jul 13, 2017
BRUKER JV ISRAEL LTD.
Alex Krokhmal
G01 - MEASURING TESTING
Information
Patent Application
MEASUREMENT OF SMALL FEATURES USING XRF
Publication number
20160123909
Publication date
May 5, 2016
JORDAN VALLEY SEMICONDUCTORS LTD.
Matthew Wormington
G01 - MEASURING TESTING
Information
Patent Application
X-RAY SCATTEROMETRY APPARATUS
Publication number
20150369759
Publication date
Dec 24, 2015
JORDAN VALLEY SEMICONDUCTORS LTD.
Isaac Mazor
G01 - MEASURING TESTING
Information
Patent Application
ESTIMATION OF XRF INTENSITY FROM AN ARRAY OF MICRO-BUMPS
Publication number
20140286473
Publication date
Sep 25, 2014
JORDAN VALLEY SEMICONDUCTORS LTD.
Alex Tokar
G01 - MEASURING TESTING
Information
Patent Application
Automated selection of x-ray reflectometry measurement locations
Publication number
20090074141
Publication date
Mar 19, 2009
JORDAN VALLEY SEMICONDUCTORS LTD.
Isaac Mazor
G01 - MEASURING TESTING
Information
Patent Application
Automated selection of X-ray reflectometry measurement locations
Publication number
20070274447
Publication date
Nov 29, 2007
Isaac Mazor
G01 - MEASURING TESTING
Information
Patent Application
Overlay metrology using X-rays
Publication number
20070224518
Publication date
Sep 27, 2007
Boris Yokhin
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
Detection of dishing and tilting using x-ray fluorescence
Publication number
20060227931
Publication date
Oct 12, 2006
Isaac Mazor
G01 - MEASURING TESTING
Information
Patent Application
MATERIAL ANALYSIS USING MULTIPLE X-RAY REFLECTOMETRY MODELS
Publication number
20060188062
Publication date
Aug 24, 2006
Dileep Agnihotri
G01 - MEASURING TESTING
Information
Patent Application
X-ray reflectometry of thin film layers with enhanced accuracy
Publication number
20060153333
Publication date
Jul 13, 2006
David Berman
G01 - MEASURING TESTING
Information
Patent Application
X-ray reflectometry with small-angle scattering measurement
Publication number
20040156474
Publication date
Aug 12, 2004
JORDAN VALLEY APPLIED RADIATION LTD.
Boris Yokhin
G01 - MEASURING TESTING
Information
Patent Application
X-ray reflectometry of thin film layers with enhanced accuracy
Publication number
20040131151
Publication date
Jul 8, 2004
David Berman
G01 - MEASURING TESTING
Information
Patent Application
X-ray reflectometer
Publication number
20040028186
Publication date
Feb 12, 2004
Boris Yokhin
G01 - MEASURING TESTING
Information
Patent Application
X-ray reflectometer
Publication number
20030072413
Publication date
Apr 17, 2003
Boris Yokhin
G01 - MEASURING TESTING
Information
Patent Application
X-ray reflectometer
Publication number
20020150208
Publication date
Oct 17, 2002
Boris Yokhin
G01 - MEASURING TESTING