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Alexander Grenov
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Madison, WI, US
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Patents Grants
last 30 patents
Information
Patent Grant
Image analysis system and method
Patent number
11,057,599
Issue date
Jul 6, 2021
Thermo Electron Scientific Instruments LLC
Alexander Grenov
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Image analysis system and method
Patent number
10,630,951
Issue date
Apr 21, 2020
Thermo Electron Scientific Instruments LLC
Alexander Grenov
G01 - MEASURING TESTING
Information
Patent Grant
Multi-component regression/multi-component analysis of time series...
Patent number
9,383,308
Issue date
Jul 5, 2016
Thermo Electron Scientific Instruments LLC
Michael S. Bradley
G01 - MEASURING TESTING
Information
Patent Grant
Efficient spectral matching, particularly for multicomponent spectra
Patent number
7,698,098
Issue date
Apr 13, 2010
Thermo Electron Scientific Instruments LLC
Gary L. Ritter
G01 - MEASURING TESTING
Information
Patent Grant
Spectroscopic microscopy with image-driven analysis
Patent number
7,496,220
Issue date
Feb 24, 2009
Thermo Electron Scientific Instruments LLC
Federico Izzia
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Auto-focus for Spectrometers
Publication number
20230194346
Publication date
Jun 22, 2023
Thermo Electron Scientific Instruments LLC
Alexander GRENOV
G01 - MEASURING TESTING
Information
Patent Application
IMAGE ANALYSIS SYSTEM AND METHOD
Publication number
20200213569
Publication date
Jul 2, 2020
Thermo Electron Scientific Instruments LLC
Alexander GRENOV
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
IMAGE ANALYSIS SYSTEM AND METHOD
Publication number
20170078634
Publication date
Mar 16, 2017
Thermo Electron Scientific Instruments LLC
Alexander GRENOV
G01 - MEASURING TESTING
Information
Patent Application
Multi-Component Regression/Multi-Component Analysis of Time Series...
Publication number
20130096883
Publication date
Apr 18, 2013
Michael S. BRADLEY
G01 - MEASURING TESTING
Information
Patent Application
EFFICIENT SPECTRAL MATCHING, PARTICULARLY FOR MULTICOMPONENT SPECTRA
Publication number
20090210194
Publication date
Aug 20, 2009
Garry L. Ritter
G01 - MEASURING TESTING
Information
Patent Application
SPECTROSCOPIC MICROSCOPY WITH IMAGE-DRIVEN ANALYSIS
Publication number
20080049220
Publication date
Feb 28, 2008
Federico Izzia
G02 - OPTICS